A Low Overhead High Test Compression Technique Using Pattern Clustering With n-Detection Test Support

This paper presents a test data compression scheme that can be used to further improve compressions achieved by linear-feedback shift register (LFSR) reseeding. The proposed compression technique can be implemented with very low hardware overhead. The test data to be stored in the automatic test equ...

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Veröffentlicht in:	IEEE transactions on very large scale integration (VLSI) systems Jg. 18; H. 12; S. 1672 - 1685
Hauptverfasser:	Wang, Seongmoon, Wei, Wenlong, Wang, Zhanglei
Format:	Journal Article
Sprache:	Englisch
Veröffentlicht:	New York, NY IEEE 01.12.2010 Institute of Electrical and Electronics Engineers The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Schlagworte:	Applied sciences Automatic test equipment Automatic testing Circuit faults Circuit properties Circuit testing Digital circuits Electric, optical and optoelectronic circuits Electronic circuits Electronics Exact sciences and technology Hardware Image coding linear decompression Linear-feedback shift register (LFSR) reseeding n-detection testing Pattern clustering Shift registers Studies Test data compression Test pattern generators Test systems Testing, measurement, noise and reliability test data compression linear decompression Data compression Feedback regulation Compact design Automatic test Linear-feedback shift register (LFSR) reseeding Stuck at fault Aggregation Shift register n-detection testing Testing equipment Deterministic approach
ISSN:	1063-8210, 1557-9999
Online-Zugang:	Volltext
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