APA (7th ed.) Citation

Wang, S., Wei, W., & Wang, Z. (2010). A Low Overhead High Test Compression Technique Using Pattern Clustering With n-Detection Test Support. IEEE transactions on very large scale integration (VLSI) systems, 18(12), 1672-1685. https://doi.org/10.1109/TVLSI.2009.2026420

Chicago Style (17th ed.) Citation

Wang, Seongmoon, Wenlong Wei, and Zhanglei Wang. "A Low Overhead High Test Compression Technique Using Pattern Clustering With N-Detection Test Support." IEEE Transactions on Very Large Scale Integration (VLSI) Systems 18, no. 12 (2010): 1672-1685. https://doi.org/10.1109/TVLSI.2009.2026420.

MLA (9th ed.) Citation

Wang, Seongmoon, et al. "A Low Overhead High Test Compression Technique Using Pattern Clustering With N-Detection Test Support." IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 18, no. 12, 2010, pp. 1672-1685, https://doi.org/10.1109/TVLSI.2009.2026420.