HALTRAV: Design of a High-Performance and Area-Efficient Latch With Triple-Node-Upset Recovery and Algorithm-Based Verifications

With the rapid advancement of semiconductor technologies, latches become increasingly sensitive to soft errors, especially triple node upsets (TNUs), in harsh radiation environments. In this article, we first propose a high-performance and area-efficient latch, namely, HALTRAV, featuring complete TN...

Celý popis

Uloženo v:
Podrobná bibliografie
Vydáno v:IEEE transactions on computer-aided design of integrated circuits and systems Ročník 44; číslo 6; s. 2367 - 2377
Hlavní autoři: Guo, Xing, Zhang, Jiajia, Meng, Xu, Li, Zhenmin, Wen, Xiaoqing, Girard, Patrick, Liang, Bin, Yan, Aibin
Médium: Journal Article
Jazyk:angličtina
Vydáno: New York IEEE 01.06.2025
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Témata:
Algorithm-based verification
Algorithms
Computer science
Delay
Delays
Design automation
Electronic design automation
Engineering Sciences
Integrated circuit reliability
Inverters
latch design
Latches
Micro and nanotechnologies
Microelectronics
Nodes
Radiation hardening (electronics)
Recovery
Reliability engineering
Simulation
Soft errors
source-drain cross-coupled inverters (SCIs)
Transistors
triple node upset (TNU)
Verification
Algorithm-based verification
Triple node upset
Latch design
Source-drain cross-coupled inverters
ISSN:0278-0070, 1937-4151
On-line přístup:Získat plný text
Tagy: Přidat tag
Žádné tagy, Buďte první, kdo vytvoří štítek k tomuto záznamu!
Popis
Shrnutí:With the rapid advancement of semiconductor technologies, latches become increasingly sensitive to soft errors, especially triple node upsets (TNUs), in harsh radiation environments. In this article, we first propose a high-performance and area-efficient latch, namely, HALTRAV, featuring complete TNU-recovery. The storage portion of HALTRAV consists of 28 interlocked source-drain cross-coupled inverters (SCIs) for complete TNU-recovery with area efficiency and low delay. To mitigate the issue that node-upset-recovery verifications for existing latches highly relies on electronic design automation tools, we further propose an algorithm-based verification method that can automatically verify the node-upset-recovery of latches, which greatly simplifies the reliability-verification flow. Simulation results demonstrate the TNU-recovery of HALTRAV and also show that HALTRAV achieves 40.38%, 8.17%, and 31.89% reduction in delay, area, and delay-power-area product (DPAP) on average, respectively; however; it is at the cost of power as compared to typical latches that are TNU-recoverable. Comparison results also demonstrate the moderate sensitivity of HALTRAV to the impacts of the process, voltage, and temperature (PVT) variations.
Bibliografie:ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
ISSN:0278-0070
1937-4151
DOI:10.1109/TCAD.2024.3511335