An Implicit Enumeration Algorithm to Generate Tests for Combinational Logic Circuits

The D-algorithm (DALG) is shown to be ineffective for the class of combinational logic circuits that is used to implement error correction and translation (ECAT) functions. PODEM (path-oriented decision making) is a new test generation algorithm for combinational logic circuits. PODEM uses an implic...

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Bibliographic Details
Published in:IEEE transactions on computers Vol. C-30; no. 3; pp. 215 - 222
Main Author: Goel
Format: Journal Article
Language:English
Published: IEEE 01.03.1981
Subjects:
Circuit faults
Circuits
Combinational circuits
Combinational logic
Computers
D-algorithm
decision tree
Decision trees
error correction
implicit enumeration
Integer programming
Logic
Logic gates
Search problems
stuck faults
test generation
Test pattern generators
untestable fault
ISSN:0018-9340, 1557-9956
Online Access:Get full text
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Summary:The D-algorithm (DALG) is shown to be ineffective for the class of combinational logic circuits that is used to implement error correction and translation (ECAT) functions. PODEM (path-oriented decision making) is a new test generation algorithm for combinational logic circuits. PODEM uses an implicit enumeration approach analogous to that used for solving 0-1 integer programming problems. It is shown that PODEM is very efficient for ECAT circuits and is significantly more efficient than DALG over the general spectrum of combinational logic circuits. A distinctive feature of PODEM is its simplicity when compared to the D-algorithm. PODEM is a complete algorithm in that it will generate a test if one exists. Heuristics are used to achieve an efficient implicit search of the space of all possible primary input patterns until either a test is found or the space is exhausted.
ISSN:0018-9340
1557-9956
DOI:10.1109/TC.1981.1675757