A Novel Evolutionary Approach for Adaptive Random Testing
Random testing is a low cost strategy that can be applied to a wide range of testing problems. While the cost and straightforward application of random testing are appealing, these benefits must be evaluated against the reduced effectiveness due to the generality of the approach. Recently, a number...
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| Vydáno v: | IEEE transactions on reliability Ročník 58; číslo 4; s. 619 - 633 |
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| Hlavní autoři: | , |
| Médium: | Journal Article |
| Jazyk: | angličtina |
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New York
IEEE
01.12.2009
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
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| ISSN: | 0018-9529, 1558-1721 |
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| Abstract | Random testing is a low cost strategy that can be applied to a wide range of testing problems. While the cost and straightforward application of random testing are appealing, these benefits must be evaluated against the reduced effectiveness due to the generality of the approach. Recently, a number of novel techniques, coined Adaptive Random Testing, have sought to increase the effectiveness of random testing by attempting to maximize the testing coverage of the input domain. This paper presents the novel application of an evolutionary search algorithm to this problem. The results of an extensive simulation study are presented in which the evolutionary approach is compared against the Fixed Size Candidate Set (FSCS), Restricted Random Testing (RRT), quasi-random testing using the Sobol sequence (Sobol), and random testing (RT) methods. The evolutionary approach was found to be superior to FSCS, RRT, Sobol, and RT amongst block patterns, the arena in which FSCS, and RRT have demonstrated the most appreciable gains in testing effectiveness. The results among fault patterns with increased complexity were shown to be similar to those of FSCS, and RRT; and showed a modest improvement over Sobol, and RT. A comparison of the asymptotic and empirical runtimes of the evolutionary search algorithm, and the other testing approaches, was also considered, providing further evidence that the application of an evolutionary search algorithm is feasible, and within the same order of time complexity as the other adaptive random testing approaches. |
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| AbstractList | Random testing is a low cost strategy that can be applied to a wide range of testing problems. While the cost and straightforward application of random testing are appealing, these benefits must be evaluated against the reduced effectiveness due to the generality of the approach. Recently, a number of novel techniques, coined Adaptive Random Testing, have sought to increase the effectiveness of random testing by attempting to maximize the testing coverage of the input domain. This paper presents the novel application of an evolutionary search algorithm to this problem. The results of an extensive simulation study are presented in which the evolutionary approach is compared against the Fixed Size Candidate Set (FSCS), Restricted Random Testing (RRT), quasi-random testing using the Sobol sequence (Sobol), and random testing (RT) methods. The evolutionary approach was found to be superior to FSCS, RRT, Sobol, and RT amongst block patterns, the arena in which FSCS, and RRT have demonstrated the most appreciable gains in testing effectiveness. The results among fault patterns with increased complexity were shown to be similar to those of FSCS, and RRT; and showed a modest improvement over Sobol, and RT. A comparison of the asymptotic and empirical runtimes of the evolutionary search algorithm, and the other testing approaches, was also considered, providing further evidence that the application of an evolutionary search algorithm is feasible, and within the same order of time complexity as the other adaptive random testing approaches. A comparison of the asymptotic and empirical runtimes of the evolutionary search algorithm, and the other testing approaches, was also considered, providing further evidence that the application of an evolutionary search algorithm is feasible, and within the same order of time complexity as the other adaptive random testing approaches. |
| Author | Miller, J. Tappenden, A.F. |
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| Cites_doi | 10.1109/32.988709 10.1145/1159733.1159751 10.1016/0951-8320(91)90052-9 10.1016/j.jss.2007.05.037 10.1145/271771.271785 10.1109/QSIC.2006.48 10.1145/1389095.1389433 10.1109/QSIC.2004.1357947 10.1016/j.eswa.2009.02.049 10.1109/TSE.2004.1265732 10.1109/ASWEC.2007.20 10.1109/TC.1978.1674994 10.1109/TSE.1984.5010257 10.1145/42288.214372 10.1109/HICSS.2007.67 10.1109/52.819971 10.1016/0950-5849(88)90037-7 10.1109/TC.1979.1675415 10.1023/A:1021634422504 10.1109/12.2185 10.1007/s10664-006-9026-0 10.1109/ASWEC.2006.25 10.1016/S0164-1212(01)00028-0 10.1109/TR.2007.903293 10.1109/WSC.2006.323184 10.1016/0041-5553(76)90154-3 10.1016/0950-5849(96)01103-2 10.1109/QSIC.2003.1319079 10.1145/22721.356187 10.1109/TSE.2007.38 10.1145/1363102.1363107 10.1016/j.jss.2005.05.029 10.1023/B:HEUR.0000026900.92269.ec 10.1145/198429.198436 10.1037/0033-2909.112.1.155 10.1016/0041-5553(79)90085-5 |
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| SubjectTerms | Adaptive algorithms Adaptive random testing Algorithms Analysis of variance Application software Asymptotic properties automated testing Automatic testing Biological cells Complexity Costs Evolutionary Evolutionary algorithms evolutionary computing and genetic algorithms Gain Genetic algorithms Power capacitors random testing Runtime Search algorithms Software testing Strategy Studies Subspace constraints test generation test strategies |
| Title | A Novel Evolutionary Approach for Adaptive Random Testing |
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