Interpreting Surface Degradation of HTV Silicone Rubber Filled with Micro/Nano-Silica Under AC and DC Voltages
In this study, high-temperature vulcanized silicone rubber filled with different concentrations of micro- and nano-sized silica were tested under synergistic exposure to multi-stress conditions for a time period of 5000 h separately under alternating current and direct current voltages. Different ch...
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| Vydáno v: | Journal of electronic materials Ročník 49; číslo 9; s. 5399 - 5410 |
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01.09.2020
Springer Nature B.V |
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| ISSN: | 0361-5235, 1543-186X |
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| Abstract | In this study, high-temperature vulcanized silicone rubber filled with different concentrations of micro- and nano-sized silica were tested under synergistic exposure to multi-stress conditions for a time period of 5000 h separately under alternating current and direct current voltages. Different characterization methods were used to evaluate the degradation performance. After each aging cycle, leakage current was measured and hydrophobicity classifications were determined by using contact angle measurement and amethod proposed by the Swedish Transmission Research Institute. Scanning electron microscopic study and Fourier transform infrared spectroscopy were performed for each test sample. Mechanical performance was assessed by measuring hardness, tensile strength and elongation-at-break. An outcome of this investigation revealed that samples stressed with DC voltage experienced 20–30% degradation compared to AC-stressed samples under common environmental stresses. All hybrid composites were found more resistant to aging but to a different degree depending on the composition. The test sample designated as TS2 was found to offer the highest resistance to aging. |
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| AbstractList | In this study, high-temperature vulcanized silicone rubber filled with different concentrations of micro- and nano-sized silica were tested under synergistic exposure to multi-stress conditions for a time period of 5000 h separately under alternating current and direct current voltages. Different characterization methods were used to evaluate the degradation performance. After each aging cycle, leakage current was measured and hydrophobicity classifications were determined by using contact angle measurement and amethod proposed by the Swedish Transmission Research Institute. Scanning electron microscopic study and Fourier transform infrared spectroscopy were performed for each test sample. Mechanical performance was assessed by measuring hardness, tensile strength and elongation-at-break. An outcome of this investigation revealed that samples stressed with DC voltage experienced 20–30% degradation compared to AC-stressed samples under common environmental stresses. All hybrid composites were found more resistant to aging but to a different degree depending on the composition. The test sample designated as TS2 was found to offer the highest resistance to aging. In this study, high-temperature vulcanized silicone rubber filled with different concentrations of micro- and nano-sized silica were tested under synergistic exposure to multi-stress conditions for a time period of 5000 h separately under alternating current and direct current voltages. Different characterization methods were used to evaluate the degradation performance. After each aging cycle, leakage current was measured and hydrophobicity classifications were determined by using contact angle measurement and amethod proposed by the Swedish Transmission Research Institute. Scanning electron microscopic study and Fourier transform infrared spectroscopy were performed for each test sample. Mechanical performance was assessed by measuring hardness, tensile strength and elongation-at-break. An outcome of this investigation revealed that samples stressed with DC voltage experienced 20–30% degradation compared to AC-stressed samples under common environmental stresses. All hybrid composites were found more resistant to aging but to a different degree depending on the composition. The test sample designated as TS2 was found to offer the highest resistance to aging. |
| Author | Ullah, Rahmat Akbar, Muhammad Abdul Karim, M. R. |
| Author_xml | – sequence: 1 givenname: Muhammad surname: Akbar fullname: Akbar, Muhammad organization: Faculty of Electrical Engineering, GIK Institute of Engineering Sciences and Technology – sequence: 2 givenname: Rahmat orcidid: 0000-0001-6516-9382 surname: Ullah fullname: Ullah, Rahmat email: rahmat.ullah@giki.edu.pk organization: Faculty of Electrical Engineering, GIK Institute of Engineering Sciences and Technology – sequence: 3 givenname: M. R. surname: Abdul Karim fullname: Abdul Karim, M. R. organization: Faculty of Materials and Chemical Engineering, GIK Institute of Engineering Sciences and Technology |
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| Cites_doi | 10.1109/TPWRD.2007.893184 10.1016/j.matlet.2017.08.077 10.1109/TDEI.2010.5448119 10.1109/94.798114 10.1016/j.polymertesting.2018.12.011 10.1109/TDEI.2018.007125 10.1109/MEI.2004.1318835 10.1016/j.engfailanal.2020.104449 10.1016/B978-0-08-102290-0.00018-0 10.1109/61.180353 10.1109/TDEI.2017.006247 10.1109/94.368659 10.1049/hve.2018.5004 10.1109/TDEI.2016.7736840 10.1109/TDEI.2005.1561790 10.1109/TDEI.2015.7076799 10.1016/j.progpolymsci.2003.08.002 10.1109/61.193998 |
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| Keywords | mechanical strength Surface degradation high-temperature vulcanized silicone rubber aging functional group nano fillers silica |
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| References | MeyerLHCherneyEAJayaramSHIEEE Electr. Insul. Mag2004201310.1109/MEI.2004.1318835 Olave, C., Romero, E., Trinidad, P., Sundararajan, R., & Trepanier, B. In IEEE Power Engineering Society General Meeting (2005) pp. 1006-1012. GorusRSCherneyEAHackamRIEEE Trans. Power Del.19883189210.1109/61.193998 ChakrabortyRReddyBSIEEE Trans. Dielectr. Electr. Insul.20172417511:CAS:528:DC%2BC1cXktlelsrY%3D10.1109/TDEI.2017.006247 SchneiderHMGuidiWWBurnhamJTGorurRSHallJFIEEE Trans. Power Del.199383251:CAS:528:DyaK3sXitlGltbc%3D10.1109/61.180353 El-Hag, A. H., Jayaram, S. H., & Cherney, E. A. In The 17th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2004. pp. 385-388. Standard, A. S. T. M. (2006). D1708: Standard Test Method for Tensile Properties of Plastics by Use of Microtensile Specimens. MomenGFarzanehMRev. Adv. Mater. Sci20112711:CAS:528:DC%2BC38XhtFCrsLk%3D AkbarMUllahRQaziIEng. Fail. Anal.20201101044491:CAS:528:DC%2BB3cXjs1Wnsbw%3D10.1016/j.engfailanal.2020.104449 Gubanski, S. M. In 1988 Fifth International Conference on Dielectric Materials, Measurements and Applications (1988, June), pp. 37-40. NazirMTPhungBTHigh voltage2018329510.1049/hve.2018.5004 ZhuYPolym. Test201974141:CAS:528:DC%2BC1cXisFers7zJ10.1016/j.polymertesting.2018.12.011 StandardASTMD22402005West Conshohoken, PA, USAASTM International STRI Hydrophobicity Classification Guide, 92/1, 1992. AnsorgeSSchmuckFPapailiouKOIEEE Trans. Dielectr. Electr. Insul.2015229791:CAS:528:DC%2BC2MXnvVakt7c%3D10.1109/TDEI.2015.7076799 Pakistan meteorological department. [Online]. Available: http://www.pmd.gov.pk/ [19.12.2018] VenkatesuluBYTMJThomasMJ. IEEE Trans. Dielectr. Electr. Insul2010176151:CAS:528:DC%2BC3cXlvFWnsr0%3D10.1109/TDEI.2010.5448119 NazirMTPhungBTHoffmanMIEEE Trans. Dielectr. Electr. Insul.20162328041:CAS:528:DC%2BC1cXislajtrw%3D10.1109/TDEI.2016.7736840 NazirMTPhungBTHoffmanMYuSLiSMater. Lett.201920942110.1016/j.matlet.2017.08.077 CherneyEATransIEEEDielectr. Electr. Insul.20051211081:CAS:528:DC%2BD2MXhtlGgtbfN10.1109/TDEI.2005.1561790 Gorur, R. S., Gedach, D. W., & Thallam, R. S. In 1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena (1991, October). Pp. 268-273. Ullah, R., Akbar, M., & Amin, S. Appl. Nanosci., 1 (2020). GrassieNScottGPolymer degradation and stabilization1985New YorkCambridge University Press Ching, Y. C., Gunathilake, T. U., Ching, K. Y., Chuah, C. H., Sandu, V., Singh, R., & Liou, N. S. In Durability and Life Prediction in Biocomposites, Fibre-Reinforced Composites and Hybrid Composites (2019), pp. 407-426. AkbarMUllahRAlamSMater. Res. Express20196102 SundararajanROlaveCRomeroETrepanierBIEEE Trans. Power Del.20072210791:CAS:528:DC%2BD2sXkvFeht7g%3D10.1109/TPWRD.2007.893184 https://www.q-lab.com/documents/public/d6f438b3-dd28-4126-b3fd-659958759358.pdf NazirMTPhungBTYuSLiSIEEE Trans. Dielectr. Electr. Insul.20182520761:CAS:528:DC%2BC1MXpslyjtr8%3D10.1109/TDEI.2018.007125 RaySSOkamotoMProg. Polym. Sci.20032815391:CAS:528:DC%2BD3sXoslOhsbk%3D10.1016/j.progpolymsci.2003.08.002 Rochow, E. G. The chemistry of silicon: Pergamon International Library of Science, Technology, Engineering and Social Studies Vol. 9 (Elsevier, 2013). Fourmigue, J. M., Noel, M., & Riquel, G. In Proceedings of 1995 Conference on Electrical Insulation and Dielectric Phenomena (1995, October), pp. 404-407. Hackam, R. (1999). IEEE Trans. Dielectr. Electr. Insul 6, 557 (1999). ChangJWGorurRSIEEE Trans. Dielectr. Electr. Insul.19941103910.1109/94.368659 S Ansorge (8265_CR16) 2015; 22 N Grassie (8265_CR30) 1985 RS Gorus (8265_CR32) 1988; 3 LH Meyer (8265_CR33) 2004; 20 R Chakraborty (8265_CR23) 2017; 24 HM Schneider (8265_CR26) 1993; 8 M Akbar (8265_CR2) 2019; 6 JW Chang (8265_CR31) 1994; 1 G Momen (8265_CR15) 2011; 27 SS Ray (8265_CR18) 2003; 28 8265_CR9 8265_CR19 8265_CR8 8265_CR5 Y Zhu (8265_CR7) 2019; 74 8265_CR12 8265_CR13 8265_CR10 MT Nazir (8265_CR22) 2019; 209 8265_CR11 ASTM Standard (8265_CR29) 2005 BYTMJ Venkatesulu (8265_CR17) 2010; 17 MT Nazir (8265_CR3) 2018; 25 EA Cherney (8265_CR1) 2005; 12 MT Nazir (8265_CR6) 2016; 23 8265_CR27 8265_CR28 R Sundararajan (8265_CR14) 2007; 22 8265_CR25 8265_CR24 8265_CR20 M Akbar (8265_CR21) 2020; 110 MT Nazir (8265_CR4) 2018; 3 |
| References_xml | – reference: AnsorgeSSchmuckFPapailiouKOIEEE Trans. Dielectr. Electr. Insul.2015229791:CAS:528:DC%2BC2MXnvVakt7c%3D10.1109/TDEI.2015.7076799 – reference: StandardASTMD22402005West Conshohoken, PA, USAASTM International – reference: Ching, Y. C., Gunathilake, T. U., Ching, K. Y., Chuah, C. H., Sandu, V., Singh, R., & Liou, N. S. In Durability and Life Prediction in Biocomposites, Fibre-Reinforced Composites and Hybrid Composites (2019), pp. 407-426. – reference: ChakrabortyRReddyBSIEEE Trans. Dielectr. Electr. Insul.20172417511:CAS:528:DC%2BC1cXktlelsrY%3D10.1109/TDEI.2017.006247 – reference: Gorur, R. S., Gedach, D. W., & Thallam, R. S. In 1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena (1991, October). Pp. 268-273. – reference: Olave, C., Romero, E., Trinidad, P., Sundararajan, R., & Trepanier, B. In IEEE Power Engineering Society General Meeting (2005) pp. 1006-1012. – reference: GorusRSCherneyEAHackamRIEEE Trans. Power Del.19883189210.1109/61.193998 – reference: MomenGFarzanehMRev. Adv. Mater. Sci20112711:CAS:528:DC%2BC38XhtFCrsLk%3D – reference: Ullah, R., Akbar, M., & Amin, S. Appl. Nanosci., 1 (2020). – reference: ChangJWGorurRSIEEE Trans. Dielectr. Electr. Insul.19941103910.1109/94.368659 – reference: SundararajanROlaveCRomeroETrepanierBIEEE Trans. Power Del.20072210791:CAS:528:DC%2BD2sXkvFeht7g%3D10.1109/TPWRD.2007.893184 – reference: CherneyEATransIEEEDielectr. Electr. Insul.20051211081:CAS:528:DC%2BD2MXhtlGgtbfN10.1109/TDEI.2005.1561790 – reference: NazirMTPhungBTHoffmanMIEEE Trans. Dielectr. Electr. Insul.20162328041:CAS:528:DC%2BC1cXislajtrw%3D10.1109/TDEI.2016.7736840 – reference: El-Hag, A. H., Jayaram, S. H., & Cherney, E. A. In The 17th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2004. pp. 385-388. – reference: STRI Hydrophobicity Classification Guide, 92/1, 1992. – reference: SchneiderHMGuidiWWBurnhamJTGorurRSHallJFIEEE Trans. Power Del.199383251:CAS:528:DyaK3sXitlGltbc%3D10.1109/61.180353 – reference: Gubanski, S. M. In 1988 Fifth International Conference on Dielectric Materials, Measurements and Applications (1988, June), pp. 37-40. – reference: VenkatesuluBYTMJThomasMJ. IEEE Trans. Dielectr. Electr. Insul2010176151:CAS:528:DC%2BC3cXlvFWnsr0%3D10.1109/TDEI.2010.5448119 – reference: NazirMTPhungBTHoffmanMYuSLiSMater. Lett.201920942110.1016/j.matlet.2017.08.077 – reference: GrassieNScottGPolymer degradation and stabilization1985New YorkCambridge University Press – reference: RaySSOkamotoMProg. Polym. Sci.20032815391:CAS:528:DC%2BD3sXoslOhsbk%3D10.1016/j.progpolymsci.2003.08.002 – reference: AkbarMUllahRQaziIEng. Fail. Anal.20201101044491:CAS:528:DC%2BB3cXjs1Wnsbw%3D10.1016/j.engfailanal.2020.104449 – reference: NazirMTPhungBTHigh voltage2018329510.1049/hve.2018.5004 – reference: https://www.q-lab.com/documents/public/d6f438b3-dd28-4126-b3fd-659958759358.pdf – reference: MeyerLHCherneyEAJayaramSHIEEE Electr. Insul. Mag2004201310.1109/MEI.2004.1318835 – reference: Pakistan meteorological department. [Online]. Available: http://www.pmd.gov.pk/ [19.12.2018] – reference: Rochow, E. G. The chemistry of silicon: Pergamon International Library of Science, Technology, Engineering and Social Studies Vol. 9 (Elsevier, 2013). – reference: ZhuYPolym. Test201974141:CAS:528:DC%2BC1cXisFers7zJ10.1016/j.polymertesting.2018.12.011 – reference: AkbarMUllahRAlamSMater. Res. Express20196102 – reference: NazirMTPhungBTYuSLiSIEEE Trans. Dielectr. Electr. Insul.20182520761:CAS:528:DC%2BC1MXpslyjtr8%3D10.1109/TDEI.2018.007125 – reference: Hackam, R. (1999). IEEE Trans. Dielectr. Electr. Insul 6, 557 (1999). – reference: Fourmigue, J. M., Noel, M., & Riquel, G. In Proceedings of 1995 Conference on Electrical Insulation and Dielectric Phenomena (1995, October), pp. 404-407. – reference: Standard, A. S. T. M. (2006). D1708: Standard Test Method for Tensile Properties of Plastics by Use of Microtensile Specimens. – ident: 8265_CR13 – volume: 22 start-page: 1079 year: 2007 ident: 8265_CR14 publication-title: IEEE Trans. Power Del. doi: 10.1109/TPWRD.2007.893184 – volume: 209 start-page: 421 year: 2019 ident: 8265_CR22 publication-title: Mater. Lett. doi: 10.1016/j.matlet.2017.08.077 – volume: 17 start-page: 615 year: 2010 ident: 8265_CR17 publication-title: J. IEEE Trans. Dielectr. Electr. Insul doi: 10.1109/TDEI.2010.5448119 – ident: 8265_CR8 doi: 10.1109/94.798114 – volume: 74 start-page: 14 year: 2019 ident: 8265_CR7 publication-title: Polym. Test doi: 10.1016/j.polymertesting.2018.12.011 – volume-title: D2240 year: 2005 ident: 8265_CR29 – volume: 25 start-page: 2076 year: 2018 ident: 8265_CR3 publication-title: IEEE Trans. Dielectr. Electr. Insul. doi: 10.1109/TDEI.2018.007125 – ident: 8265_CR24 – ident: 8265_CR9 – ident: 8265_CR28 – ident: 8265_CR5 – volume: 27 start-page: 1 year: 2011 ident: 8265_CR15 publication-title: Rev. Adv. Mater. Sci – volume: 20 start-page: 13 year: 2004 ident: 8265_CR33 publication-title: IEEE Electr. Insul. Mag doi: 10.1109/MEI.2004.1318835 – ident: 8265_CR10 – volume: 110 start-page: 104449 year: 2020 ident: 8265_CR21 publication-title: Eng. Fail. Anal. doi: 10.1016/j.engfailanal.2020.104449 – ident: 8265_CR12 – ident: 8265_CR11 doi: 10.1016/B978-0-08-102290-0.00018-0 – volume: 8 start-page: 325 year: 1993 ident: 8265_CR26 publication-title: IEEE Trans. Power Del. doi: 10.1109/61.180353 – volume: 24 start-page: 1751 year: 2017 ident: 8265_CR23 publication-title: IEEE Trans. Dielectr. Electr. Insul. doi: 10.1109/TDEI.2017.006247 – ident: 8265_CR20 – volume-title: Polymer degradation and stabilization year: 1985 ident: 8265_CR30 – volume: 1 start-page: 1039 year: 1994 ident: 8265_CR31 publication-title: IEEE Trans. Dielectr. Electr. Insul. doi: 10.1109/94.368659 – volume: 3 start-page: 295 year: 2018 ident: 8265_CR4 publication-title: High voltage doi: 10.1049/hve.2018.5004 – ident: 8265_CR25 – volume: 23 start-page: 2804 year: 2016 ident: 8265_CR6 publication-title: IEEE Trans. Dielectr. Electr. Insul. doi: 10.1109/TDEI.2016.7736840 – volume: 12 start-page: 1108 year: 2005 ident: 8265_CR1 publication-title: Dielectr. Electr. Insul. doi: 10.1109/TDEI.2005.1561790 – volume: 6 start-page: 102 year: 2019 ident: 8265_CR2 publication-title: Mater. Res. Express – volume: 22 start-page: 979 year: 2015 ident: 8265_CR16 publication-title: IEEE Trans. Dielectr. Electr. Insul. doi: 10.1109/TDEI.2015.7076799 – ident: 8265_CR27 – volume: 28 start-page: 1539 year: 2003 ident: 8265_CR18 publication-title: Prog. Polym. Sci. doi: 10.1016/j.progpolymsci.2003.08.002 – ident: 8265_CR19 – volume: 3 start-page: 1892 year: 1988 ident: 8265_CR32 publication-title: IEEE Trans. Power Del. doi: 10.1109/61.193998 |
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