Thakkar, A., & Lohiya, R. (2021). A Review on Machine Learning and Deep Learning Perspectives of IDS for IoT: Recent Updates, Security Issues, and Challenges. Archives of computational methods in engineering, 28(4), 3211-3243. https://doi.org/10.1007/s11831-020-09496-0
Chicago-Zitierstil (17. Ausg.)Thakkar, Ankit, und Ritika Lohiya. "A Review on Machine Learning and Deep Learning Perspectives of IDS for IoT: Recent Updates, Security Issues, and Challenges." Archives of Computational Methods in Engineering 28, no. 4 (2021): 3211-3243. https://doi.org/10.1007/s11831-020-09496-0.
MLA-Zitierstil (9. Ausg.)Thakkar, Ankit, und Ritika Lohiya. "A Review on Machine Learning and Deep Learning Perspectives of IDS for IoT: Recent Updates, Security Issues, and Challenges." Archives of Computational Methods in Engineering, vol. 28, no. 4, 2021, pp. 3211-3243, https://doi.org/10.1007/s11831-020-09496-0.