Fourfold coordinated Te atoms in amorphous GeCu2Te3 phase change material

Amorphous GeCu2Te3 was investigated by X-ray diffraction and extended X-ray absorption fine structure measurements at the Ge, Cu and Te K-edges. Structural models were obtained by fitting the four experimental datasets simultaneously by reverse Monte Carlo simulation. It was found that Ge–Ge and Cu–...

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Vydané v:	Scripta materialia Ročník 68; číslo 2; s. 122 - 125
Hlavní autori:	Jóvári, P., Sutou, Y., Kaban, I., Saito, Y., Koike, J.
Médium:	Journal Article
Jazyk:	English
Vydavateľské údaje:	Elsevier Ltd 01.01.2013
Predmet:	Chalcogenide glasses EXAFS Modeling X-ray diffraction X-ray diffraction Modeling Chalcogenide glasses EXAFS
ISSN:	1359-6462, 1872-8456
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