APA (7th ed.) Citation

Yang, Z., Deng, L., Li, C., & Zhang, L. (2025). Optimization of Built-In Self-Test test chain configuration in 2.5D Integrated Circuits Using Constrained Multi-Objective Evolutionary Algorithm. Engineering applications of artificial intelligence, 143, 109876. https://doi.org/10.1016/j.engappai.2024.109876

Chicago Style (17th ed.) Citation

Yang, Zhe, Libao Deng, Chunlei Li, and Lili Zhang. "Optimization of Built-In Self-Test Test Chain Configuration in 2.5D Integrated Circuits Using Constrained Multi-Objective Evolutionary Algorithm." Engineering Applications of Artificial Intelligence 143 (2025): 109876. https://doi.org/10.1016/j.engappai.2024.109876.

MLA (9th ed.) Citation

Yang, Zhe, et al. "Optimization of Built-In Self-Test Test Chain Configuration in 2.5D Integrated Circuits Using Constrained Multi-Objective Evolutionary Algorithm." Engineering Applications of Artificial Intelligence, vol. 143, 2025, p. 109876, https://doi.org/10.1016/j.engappai.2024.109876.