Min, J., Chen, X., Liu, S., Wang, Z., Sun, Y., Wang, X., & Tang, Z. (2025). Model-based thickness estimation of multilayer films in picosecond ultrasonics metrology with aliased echoes. Applied acoustics, 228, 110272. https://doi.org/10.1016/j.apacoust.2024.110272
Chicago-Zitierstil (17. Ausg.)Min, Jing, Xiuguo Chen, Shiyuan Liu, Zhongyu Wang, Yong Sun, Xuesong Wang, und Zirong Tang. "Model-based Thickness Estimation of Multilayer Films in Picosecond Ultrasonics Metrology with Aliased Echoes." Applied Acoustics 228 (2025): 110272. https://doi.org/10.1016/j.apacoust.2024.110272.
MLA-Zitierstil (9. Ausg.)Min, Jing, et al. "Model-based Thickness Estimation of Multilayer Films in Picosecond Ultrasonics Metrology with Aliased Echoes." Applied Acoustics, vol. 228, 2025, p. 110272, https://doi.org/10.1016/j.apacoust.2024.110272.