Kai, C., Zang, H., Ben, J., Jiang, K., Shi, Z., Jia, Y., . . . Li, D. (2021). Origination and evolution of point defects in AlN film annealed at high temperature. Journal of luminescence, 235, 118032. https://doi.org/10.1016/j.jlumin.2021.118032
Citácia podle Chicago (17th ed.)Kai, Cuihong, et al. "Origination and Evolution of Point Defects in AlN Film Annealed at High Temperature." Journal of Luminescence 235 (2021): 118032. https://doi.org/10.1016/j.jlumin.2021.118032.
Citácia podľa MLA (8th ed.)Kai, Cuihong, et al. "Origination and Evolution of Point Defects in AlN Film Annealed at High Temperature." Journal of Luminescence, vol. 235, 2021, p. 118032, https://doi.org/10.1016/j.jlumin.2021.118032.
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