Tempelaere, A., He, J., Van Doorselaer, L., Verboven, P., Nicolai, B., & Valerio Giuffrida, M. (2024). Unsupervised anomaly detection for pome fruit quality inspection using X-ray radiography. Computers and electronics in agriculture, 226, 109364. https://doi.org/10.1016/j.compag.2024.109364
Chicago-Zitierstil (17. Ausg.)Tempelaere, Astrid, Jiaqi He, Leen Van Doorselaer, Pieter Verboven, Bart Nicolai, und Mario Valerio Giuffrida. "Unsupervised Anomaly Detection for Pome Fruit Quality Inspection Using X-ray Radiography." Computers and Electronics in Agriculture 226 (2024): 109364. https://doi.org/10.1016/j.compag.2024.109364.
MLA-Zitierstil (9. Ausg.)Tempelaere, Astrid, et al. "Unsupervised Anomaly Detection for Pome Fruit Quality Inspection Using X-ray Radiography." Computers and Electronics in Agriculture, vol. 226, 2024, p. 109364, https://doi.org/10.1016/j.compag.2024.109364.