Novel method of designing all optical frequency-encoded Fredkin and Toffoli logic gates using semiconductor optical amplifiers

Reversible logic gates have attracted significant attention to researchers in the field of optics and optoelectronics because of its wide applications in sequential and combinational circuit of optical computing, optical signal processing, and in multivalued logic operations. Several all-optical rev...

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Bibliographic Details
Published in:IET optoelectronics Vol. 5; no. 6; pp. 247 - 254
Main Author: Garai, S.K.
Format: Journal Article
Language:English
Published: Stevenage The Institution of Engineering & Technology 01.12.2011
Subjects:
Decoding
Encoding
Gates (circuits)
Logic
Optical communication
Optical data processing
Optical frequency
Optoelectronics
Semiconductor optical amplifiers
ISSN:1751-8768, 1751-8776
Online Access:Get full text
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Summary:Reversible logic gates have attracted significant attention to researchers in the field of optics and optoelectronics because of its wide applications in sequential and combinational circuit of optical computing, optical signal processing, and in multivalued logic operations. Several all-optical reversible logic gates have been proposed such as controlled NOT (Feynman gate), Fredkin gate, Toffoli gate, New Gate, Peres gate, etc. The beauty of all these reversible conservative logic gates is that all types of arithmetic and logical operation can be performed with lower hardware complexity and without loss of any input information. To perform these logic operations, encoding and decoding of optical signals are of great important issues. In this communication, the author presents a method of designing optical Fredkin gate and Toffoli gate using frequency encoding/decoding techniques due to its several inherent advantages. To develop the method of designing these two reversible logic gates, non-linear polarisation rotation of the probe beam, frequency routing, and frequency conversion properties of semiconductor optical amplifiers have been exploited.
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ISSN:1751-8768
1751-8776
DOI:10.1049/iet-opt.2010.0077