APA (7th ed.) Citation

Xu, H., Liao, L., Liu, X., Chen, S., Chen, J., Liang, Z., & Yu, Y. (2024). Fault-tolerant deep learning inference on CPU-GPU integrated edge devices with TEEs. Future generation computer systems, 161, 404-414. https://doi.org/10.1016/j.future.2024.07.027

Chicago Style (17th ed.) Citation

Xu, Hongjian, Longlong Liao, Xinqi Liu, Shuguang Chen, Jianguo Chen, Zhixuan Liang, and Yuanlong Yu. "Fault-tolerant Deep Learning Inference on CPU-GPU Integrated Edge Devices with TEEs." Future Generation Computer Systems 161 (2024): 404-414. https://doi.org/10.1016/j.future.2024.07.027.

MLA (9th ed.) Citation

Xu, Hongjian, et al. "Fault-tolerant Deep Learning Inference on CPU-GPU Integrated Edge Devices with TEEs." Future Generation Computer Systems, vol. 161, 2024, pp. 404-414, https://doi.org/10.1016/j.future.2024.07.027.