SSAE‐KPLS: A quality‐related process monitoring via integrating stacked sparse autoencoder with kernel partial least squares

Kernel partial least squares (KPLS) is widely employed to address the issue of nonlinearity inherent in complex industrial processes. However, KPLS can only extract shallow features from process measurements. This paper proposes a new quality‐related process monitoring method via integrating stacked...

Full description

Saved in:
Bibliographic Details
Published in:Canadian journal of chemical engineering Vol. 101; no. 10; pp. 5858 - 5873
Main Authors: Ye, Zhenyu, Wu, Ping, He, Yuchen, Pan, Haipeng
Format: Journal Article
Language:English
Published: Hoboken, USA John Wiley & Sons, Inc 01.10.2023
Wiley Subscription Services, Inc
Subjects:
ISSN:0008-4034, 1939-019X
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Be the first to leave a comment!
You must be logged in first