An improved single-terminal fault location method for inverter grid-connected system based on active control

•A single-terminal fault location method for inverter-interfaced system that is less influenced by fault resistance and system parameters.•Compared to traditional single-terminal fault location method, the proposed method does not require the assumption about the phase-angle of sequence impedance.•B...

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Bibliographic Details
Published in:Electric power systems research Vol. 217; p. 109100
Main Authors: Song, Guobing, Chang, Peng, Hou, Junjie, Xiong, Fuzhi
Format: Journal Article
Language:English
Published: Elsevier B.V 01.04.2023
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ISSN:0378-7796, 1873-2046
Online Access:Get full text
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Summary:•A single-terminal fault location method for inverter-interfaced system that is less influenced by fault resistance and system parameters.•Compared to traditional single-terminal fault location method, the proposed method does not require the assumption about the phase-angle of sequence impedance.•Both symmetrical and asymmetries faults can be solved by the method.•A single-terminal fault location method that needs a small amount of calculation. Single-terminal fault location methods are easily affected by fault resistance and system parameters, and they always utilize iterative algorithm to solve fault distance. To improve their performance, an improved single-terminal fault location method for inverter system based on active control is proposed in this article, which can be used for symmetrical and asymmetrical faults. First, the problem that influences the performance of fault location method is analyzed. And to solve it, a control strategy that can create two fault statuses during fault stage is proposed. Then, using the electrical quantities under the different fault stages, two irrelevant equation groups can be established, and fault distance can be solved by single-terminal data. The PSCAD/EMTDC results demonstrate that the method can achieve fault location accurately, which just requires a small amount of calculation. And it is less affected by fault resistance and system parameters.
ISSN:0378-7796
1873-2046
DOI:10.1016/j.epsr.2022.109100