Wang, X., Yan, J., & Xu, X. (2025). A novel dynamic spatio-temporal graph based condition monitoring framework for consistency retention of digital twin. Journal of manufacturing systems, 79, 455-465. https://doi.org/10.1016/j.jmsy.2025.01.006
Chicago-Zitierstil (17. Ausg.)Wang, Xiaofeng, Jihong Yan, und Xun Xu. "A Novel Dynamic Spatio-temporal Graph Based Condition Monitoring Framework for Consistency Retention of Digital Twin." Journal of Manufacturing Systems 79 (2025): 455-465. https://doi.org/10.1016/j.jmsy.2025.01.006.
MLA-Zitierstil (9. Ausg.)Wang, Xiaofeng, et al. "A Novel Dynamic Spatio-temporal Graph Based Condition Monitoring Framework for Consistency Retention of Digital Twin." Journal of Manufacturing Systems, vol. 79, 2025, pp. 455-465, https://doi.org/10.1016/j.jmsy.2025.01.006.