Application of LSTM based on the BAT-MCS for binary-state network approximated time-dependent reliability problems

•Propose the time-series reliability of the binary-state network problem.•Propose the first deep-learning algorithm to solve the problem.•The first algorithm combined the exact-algorithm and approximated-reliability algorithm for the problem.•The propose algorithm is based on LSTM, BAT, and MCS.•Val...

Ausführliche Beschreibung

Bibliographische Detailangaben

Veröffentlicht in:	Reliability engineering & system safety Jg. 235; S. 108954
Hauptverfasser:	Yeh, Wei-Chang, Du, Chia-Ming, Tan, Shi-Yi, Forghani-elahabad, Majid
Format:	Journal Article
Sprache:	Englisch
Veröffentlicht:	Elsevier Ltd 01.07.2023
Schlagworte:	Binary-addition-tree algorithm (BAT) Binary-state network reliability Long short-term memory (LSTM) Monte carlo simulation (MCS) Statistical characteristics Binary-addition-tree algorithm (BAT) Statistical characteristics Binary-state network reliability Long short-term memory (LSTM) Monte carlo simulation (MCS)
ISSN:	0951-8320, 1879-0836
Online-Zugang:	Volltext
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!