On the implementation of an analog ATPG: the nonlinear case

In order to reduce the complexity of the fault diagnosis equations and still retain computational simplicity, a self-testing algorithm has been proposed and implemented on a VMS VAX 11/780 for linear circuits. A prototype implementation of such an algorithm for nonlinear circuits and systems is pres...

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Vydané v:	IEEE transactions on instrumentation and measurement Ročník 37; číslo 2; s. 252 - 258
Hlavní autori:	Wey, C.-L., Saeks, R.
Médium:	Journal Article
Jazyk:	English
Vydavateľské údaje:	New York, NY IEEE 01.06.1988 Institute of Electrical and Electronics Engineers
Predmet:	Applied sciences Automatic test pattern generation Automatic testing Built-in self-test Circuit simulation Circuit testing Electronics Exact sciences and technology Fault diagnosis Nonlinear circuits Nonlinear equations SPICE Testing, measurement, noise and reliability Voice mail Non linear circuit Implantation Circuit parameter Simulation Algorithm Fault diagnostic
ISSN:	0018-9456, 1557-9662
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