Parametric Fault Diagnosis of Analog Circuits Based on a Semi-Supervised Algorithm

The parametric fault diagnosis of analog circuits is very crucial for condition-based maintenance (CBM) in prognosis and health management. In order to improve the diagnostic rate of parametric faults in engineering applications, a semi-supervised machine learning algorithm was used to classify the...

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Vydané v:	Symmetry (Basel) Ročník 11; číslo 2; s. 228
Hlavní autori:	Wang, Ling, Zhou, Dongfang, Tian, Hui, Zhang, Hao, Zhang, Wei
Médium:	Journal Article
Jazyk:	English
Vydavateľské údaje:	Basel MDPI AG 01.02.2019
Predmet:	Algorithms Analog circuits Circuits Classification Decision trees Discriminant analysis Eigenvalues Fault diagnosis Feature extraction Machine learning Optimization Principal components analysis Wavelet transforms
ISSN:	2073-8994, 2073-8994
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