Yadav, S. M., Shastri, S. K., Chakravarthi, G. B., Kumar, V., & A., D. R. (2018). A Fast, Parallel Algorithm for Fully Overlapped Allan Variance and Total Variance for Analysis and Modeling of Noise in Inertial Sensors. IEEE sensors letters, 2(2), 1-4. https://doi.org/10.1109/LSENS.2018.2829799
Chicago Style (17th ed.) CitationYadav, Shrikanth M., Saurav Kumaraswami Shastri, Ghanashyam B. Chakravarthi, Viraj Kumar, and Divya Rao A. "A Fast, Parallel Algorithm for Fully Overlapped Allan Variance and Total Variance for Analysis and Modeling of Noise in Inertial Sensors." IEEE Sensors Letters 2, no. 2 (2018): 1-4. https://doi.org/10.1109/LSENS.2018.2829799.
MLA (9th ed.) CitationYadav, Shrikanth M., et al. "A Fast, Parallel Algorithm for Fully Overlapped Allan Variance and Total Variance for Analysis and Modeling of Noise in Inertial Sensors." IEEE Sensors Letters, vol. 2, no. 2, 2018, pp. 1-4, https://doi.org/10.1109/LSENS.2018.2829799.