Zhong, Y., & Guin, U. (2023). Complexity Analysis of the SAT Attack on Logic Locking. IEEE transactions on computer-aided design of integrated circuits and systems, 42(10), 1. https://doi.org/10.1109/TCAD.2023.3240933
Citace podle Chicago (17th ed.)Zhong, Yadi, a Ujjwal Guin. "Complexity Analysis of the SAT Attack on Logic Locking." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems 42, no. 10 (2023): 1. https://doi.org/10.1109/TCAD.2023.3240933.
Citace podle MLA (9th ed.)Zhong, Yadi, a Ujjwal Guin. "Complexity Analysis of the SAT Attack on Logic Locking." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems, vol. 42, no. 10, 2023, p. 1, https://doi.org/10.1109/TCAD.2023.3240933.
Upozornění: Tyto citace jsou generovány automaticky. Nemusí být zcela správně podle citačních pravidel..