Accuracy of IGBT Junction Temperature Prediction: An Improved Sailfish Algorithm to Optimize Support Vector Machine

This study improves the accuracy of junction temperature prediction, as the insulated gate bipolar transistor (IGBT) reliability is important for the safe operation of its working system due to junction temperature is limited in its actual performance and reliability. A model based on an improved sa...

Full description

Saved in:

Bibliographic Details
Published in:	IEEE transactions on power electronics Vol. 39; no. 6; pp. 6864 - 6876
Main Authors:	Li, Lingling, Liu, Jiaqi, Tseng, Ming-Lang, Lim, Ming K.
Format:	Journal Article
Language:	English
Published:	New York IEEE 01.06.2024 The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects:	Accuracy Algorithms Errors Improved sailfish optimization algorithm insulated gate bipolar transistor Insulated gate bipolar transistors junction temperature prediction Junctions Optimization Optimization algorithms Performance indices Prediction algorithms Predictive models Reliability Reliability analysis Semiconductor devices support vector machine (SVM) Support vector machines System reliability Temperature measurement Temperature sensors
ISSN:	0885-8993, 1941-0107
Online Access:	Get full text
Tags:	Add Tag No Tags, Be the first to tag this record!

Be the first to leave a comment!