NEST: A Quadruple-Node Upset Recovery Latch Design and Algorithm-Based Recovery Optimization

Multinode upset induced by radiation on integrated circuits has caused many circuit reliability issues. This article proposes a single-event quadruple-node upset (QNU) recovery latch (NEST), based on four circular feedback loops that are formed by 25 C-elements to realize high robustness. NEST achie...

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Vydáno v:IEEE transactions on aerospace and electronic systems Ročník 60; číslo 4; s. 4590 - 4600
Hlavní autoři: Huang, Zhengfeng, Sun, Liting, Wang, Xu, Liang, Huaguo, Lu, Yingchun, Yan, Aibin, Pan, Jun, Wen, Xiaoqing
Médium: Journal Article
Jazyk:angličtina
Vydáno: New York IEEE 01.08.2024
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Témata:
Aerospace and electronic systems
Algorithms
Circuit reliability
Design optimization
Feedback loops
High impedance
Integrated circuits
Inverters
Latches
Logic gates
Nodes
Optimization
Optimization algorithm
Power demand
quadruple-node upset (QNU) recovery
Radiation hardening (electronics)
radiation hardening by design
Recovery
recovery rate
ISSN:0018-9251, 1557-9603
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Abstract Multinode upset induced by radiation on integrated circuits has caused many circuit reliability issues. This article proposes a single-event quadruple-node upset (QNU) recovery latch (NEST), based on four circular feedback loops that are formed by 25 C-elements to realize high robustness. NEST achieves 29.02% reduction in power consumption compared to the latch design and algorithm-based verification protected against multiple-node upset (LDAVPM) latch and 51.44% reduction in setup time compared to the quadruple-node upset recoverable and high-impedance-state insensitive latch (QRHIL) latch. NEST also achieves a 99.29% QNU recovery rate. Furthermore, a high-speed, high-precision optimization algorithm for multinode upset recovery is also proposed and implemented. This algorithm achieves 99.84 reduction in simulation time for exhaustive fault injections having equivalent accuracy with high performance simulation program with integrated circuit emphasis (HSPICE).
AbstractList Multinode upset induced by radiation on integrated circuits has caused many circuit reliability issues. This article proposes a single-event quadruple-node upset (QNU) recovery latch (NEST), based on four circular feedback loops that are formed by 25 C-elements to realize high robustness. NEST achieves 29.02% reduction in power consumption compared to the latch design and algorithm-based verification protected against multiple-node upset (LDAVPM) latch and 51.44% reduction in setup time compared to the quadruple-node upset recoverable and high-impedance-state insensitive latch (QRHIL) latch. NEST also achieves a 99.29% QNU recovery rate. Furthermore, a high-speed, high-precision optimization algorithm for multinode upset recovery is also proposed and implemented. This algorithm achieves 99.84 reduction in simulation time for exhaustive fault injections having equivalent accuracy with high performance simulation program with integrated circuit emphasis (HSPICE).
Author Lu, Yingchun
Wang, Xu
Liang, Huaguo
Wen, Xiaoqing
Pan, Jun
Sun, Liting
Huang, Zhengfeng
Yan, Aibin
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10.1109/TDMR.2016.2634626
10.1109/T-ED.1979.19370
10.1109/RADECS.2016.8093097
10.1109/TNS.2006.886223
10.1049/iet-cdt.2008.0099
10.1016/j.mejo.2021.105243
10.1515/9781400882618-003
10.1109/VTS.2017.7928930
10.1109/TCAD.2022.3213212
10.1007/s10836-015-5551-3
10.1109/TCSI.2011.2177135
10.1109/TCSI.2020.2973676
10.1109/EDSSC.2017.8126562
10.1109/16.701475
10.1109/TC.2010.24
10.1109/TNS.2002.805402
10.1109/TAES.2022.3219372
10.1109/TC.2015.2509983
10.1109/TVLSI.2022.3204827
10.1109/TNS.2013.2255624
10.1109/TNS.2013.2260357
10.1109/TETC.2020.3025584
10.1109/IRPS.2011.5784522
10.1109/TAES.2022.3216795
10.1109/TR.1964.5214855
10.1109/TETC.2017.2776285
10.1109/MSE.2007.44
10.3390/electronics10202457
10.1109/IRPS.2010.5488680
10.1109/IEDM.2001.979501
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References ref13
ref12
ref34
ref14
ref31
ref30
ref11
ref33
ref32
ref2
ref1
Huang (ref15) 2020; 43
ref17
ref16
ref19
ref18
ref24
ref23
ref26
ref25
ref20
ref22
ref21
ref28
ref27
ref8
ref7
Weste (ref10) 2010
ref9
ref4
ref3
ref6
ref5
Rabaey (ref29) 2003
References_xml – ident: ref11
  doi: 10.1109/23.556880
– ident: ref4
  doi: 10.1109/TDMR.2016.2634626
– ident: ref1
  doi: 10.1109/T-ED.1979.19370
– ident: ref31
  doi: 10.1109/RADECS.2016.8093097
– ident: ref30
  doi: 10.1109/TNS.2006.886223
– ident: ref12
  doi: 10.1049/iet-cdt.2008.0099
– ident: ref23
  doi: 10.1016/j.mejo.2021.105243
– ident: ref21
  doi: 10.1515/9781400882618-003
– ident: ref17
  doi: 10.1109/VTS.2017.7928930
– ident: ref13
  doi: 10.1109/TCAD.2022.3213212
– ident: ref28
  doi: 10.1007/s10836-015-5551-3
– ident: ref19
  doi: 10.1109/TCSI.2011.2177135
– ident: ref32
  doi: 10.1109/TCSI.2020.2973676
– ident: ref6
  doi: 10.1109/EDSSC.2017.8126562
– ident: ref9
  doi: 10.1109/16.701475
– start-page: 241
  volume-title: CMOS VLSI Design: A Circuits and Systems Perspective
  year: 2010
  ident: ref10
  article-title: Chapter 7 Robustness
– ident: ref26
  doi: 10.1109/TC.2010.24
– start-page: 237
  volume-title: Digital Integrated Circuits: A Design Perspective
  year: 2003
  ident: ref29
  article-title: Chapter 7 sequential logic circuit design
– ident: ref2
  doi: 10.1109/TNS.2002.805402
– ident: ref14
  doi: 10.1109/TAES.2022.3219372
– ident: ref27
  doi: 10.1109/TC.2015.2509983
– ident: ref33
  doi: 10.1109/TVLSI.2022.3204827
– ident: ref3
  doi: 10.1109/TNS.2013.2255624
– ident: ref5
  doi: 10.1109/TNS.2013.2260357
– ident: ref8
  doi: 10.1109/TETC.2020.3025584
– ident: ref7
  doi: 10.1109/IRPS.2011.5784522
– ident: ref34
  doi: 10.1109/TAES.2022.3216795
– ident: ref22
  doi: 10.1109/TR.1964.5214855
– ident: ref18
  doi: 10.1109/TETC.2017.2776285
– ident: ref20
  doi: 10.1109/MSE.2007.44
– volume: 43
  start-page: 2508
  issue: 9
  year: 2020
  ident: ref15
  article-title: A low-cost triple-node-upset-resilient latch design
  publication-title: J. Electron. Inf. Technol.
– ident: ref16
  doi: 10.3390/electronics10202457
– ident: ref24
  doi: 10.1109/IRPS.2010.5488680
– ident: ref25
  doi: 10.1109/IEDM.2001.979501
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SubjectTerms Aerospace and electronic systems
Algorithms
Circuit reliability
Design optimization
Feedback loops
High impedance
Integrated circuits
Inverters
Latches
Logic gates
Nodes
Optimization
Optimization algorithm
Power demand
quadruple-node upset (QNU) recovery
Radiation hardening (electronics)
radiation hardening by design
Recovery
recovery rate
Title NEST: A Quadruple-Node Upset Recovery Latch Design and Algorithm-Based Recovery Optimization
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