Vakalis, S., & Nanzer, J. A. (2019). Analysis of Element Failures in Active Incoherent Microwave Imaging Arrays Using Noise Signals. IEEE microwave and wireless components letters, 29(2), 161-163. https://doi.org/10.1109/LMWC.2018.2890246
Citace podle Chicago (17th ed.)Vakalis, Stavros, a Jeffrey A. Nanzer. "Analysis of Element Failures in Active Incoherent Microwave Imaging Arrays Using Noise Signals." IEEE Microwave and Wireless Components Letters 29, no. 2 (2019): 161-163. https://doi.org/10.1109/LMWC.2018.2890246.
Citace podle MLA (9th ed.)Vakalis, Stavros, a Jeffrey A. Nanzer. "Analysis of Element Failures in Active Incoherent Microwave Imaging Arrays Using Noise Signals." IEEE Microwave and Wireless Components Letters, vol. 29, no. 2, 2019, pp. 161-163, https://doi.org/10.1109/LMWC.2018.2890246.