Vakalis, S., & Nanzer, J. A. (2019). Analysis of Element Failures in Active Incoherent Microwave Imaging Arrays Using Noise Signals. IEEE microwave and wireless components letters, 29(2), 161-163. https://doi.org/10.1109/LMWC.2018.2890246
Chicago-Zitierstil (17. Ausg.)Vakalis, Stavros, und Jeffrey A. Nanzer. "Analysis of Element Failures in Active Incoherent Microwave Imaging Arrays Using Noise Signals." IEEE Microwave and Wireless Components Letters 29, no. 2 (2019): 161-163. https://doi.org/10.1109/LMWC.2018.2890246.
MLA-Zitierstil (9. Ausg.)Vakalis, Stavros, und Jeffrey A. Nanzer. "Analysis of Element Failures in Active Incoherent Microwave Imaging Arrays Using Noise Signals." IEEE Microwave and Wireless Components Letters, vol. 29, no. 2, 2019, pp. 161-163, https://doi.org/10.1109/LMWC.2018.2890246.