A Deterministic Far-Field Sampling Strategy for Array Diagnosis Using Sparse Recovery

A deterministic sampling strategy for failure identification in uniform linear arrays using compressed sensing/sparse recovery technique is proposed. Numerical results confirm the good performance of the technique described in this letter compared to the mean performance of the method based on rando...

Full description

Saved in:
Bibliographic Details
Published in:IEEE antennas and wireless propagation letters Vol. 17; no. 7; pp. 1261 - 1265
Main Authors: Li, Wei, Deng, Weibo, Migliore, Marco Donald
Format: Journal Article
Language:English
Published: New York IEEE 01.07.2018
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects:
ISSN:1536-1225, 1548-5757
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Abstract A deterministic sampling strategy for failure identification in uniform linear arrays using compressed sensing/sparse recovery technique is proposed. Numerical results confirm the good performance of the technique described in this letter compared to the mean performance of the method based on random sampling strategy.
AbstractList A deterministic sampling strategy for failure identification in uniform linear arrays using compressed sensing/sparse recovery technique is proposed. Numerical results confirm the good performance of the technique described in this letter compared to the mean performance of the method based on random sampling strategy.
Author Li, Wei
Migliore, Marco Donald
Deng, Weibo
Author_xml – sequence: 1
  givenname: Wei
  orcidid: 0000-0001-9144-1108
  surname: Li
  fullname: Li, Wei
  email: hit_14B905002@163.com
  organization: Department of Electronics and Information Engineering, the Key Laboratory of Marine Environmental Monitoring and Information Processing, Ministry of Industry and Information Technology, Harbin Institute of Technology, Harbin, China
– sequence: 2
  givenname: Weibo
  surname: Deng
  fullname: Deng, Weibo
  email: dengweibo@hit.edu.cn
  organization: Department of Electronics and Information Engineering, the Key Laboratory of Marine Environmental Monitoring and Information Processing, Ministry of Industry and Information Technology, Harbin Institute of Technology, Harbin, China
– sequence: 3
  givenname: Marco Donald
  orcidid: 0000-0001-9325-2933
  surname: Migliore
  fullname: Migliore, Marco Donald
  email: mdmiglio@unicas.it
  organization: DIEI, Universitá di Cassino e del Lazio Meridionale, Cassino, Italy
BookMark eNp9kM9LwzAUgINMcE7_APES8NyZpG1-HMvmVBgozuExZOnryOjamnRC_3tbNzx48JR3-L73yHeJRlVdAUI3lEwpJep-mX28ThmhcspkQnlKztCYpomMUpGK0TDHPKKMpRfoMoQdIVTwNB6jdYbn0ILfu8qF1lm8MD5aOChzvDL7pnTVFq9ab1rYdrioPc68Nx2eO7Ot6uACXocfpDE-AH4DW3-B767QeWHKANend4LWi4f32VO0fHl8nmXLyDIVt5HKVSGA5YoXkmyEiK1KcmU2JN0Qm1NpDfA84VRYlUPCBTWGg6UiKbiSwGw8QXfHvY2vPw8QWr2rD77qT2pGeMK4FFT0lDhS1tcheCi0da1pXV31H3OlpkQPDfXQUA8N9alhb9I_ZuPd3vjuX-f26DgA-OVlzCVJVfwNPZ5_BQ
CODEN IAWPA7
CitedBy_id crossref_primary_10_1109_LAWP_2019_2914529
crossref_primary_10_1002_mop_33759
crossref_primary_10_1109_LAWP_2020_3046879
crossref_primary_10_1109_TAP_2023_3293004
crossref_primary_10_1109_LAWP_2018_2874802
crossref_primary_10_1080_09205071_2022_2146004
crossref_primary_10_1109_LAWP_2024_3369088
crossref_primary_10_1109_TAP_2022_3184528
crossref_primary_10_1049_iet_map_2019_0008
crossref_primary_10_1016_j_cja_2025_103734
crossref_primary_10_1109_ACCESS_2022_3196384
crossref_primary_10_1017_S1759078719000989
crossref_primary_10_1109_TVT_2023_3290181
crossref_primary_10_3390_electronics7100257
crossref_primary_10_3390_electronics7120350
crossref_primary_10_3390_electronics7120383
crossref_primary_10_1049_el_2019_2601
crossref_primary_10_1109_TAP_2022_3209212
crossref_primary_10_1109_JSEN_2021_3125693
crossref_primary_10_1080_09205071_2019_1681300
crossref_primary_10_1080_09205071_2023_2270517
crossref_primary_10_1109_TAP_2023_3343406
crossref_primary_10_1002_mop_33314
Cites_doi 10.1109/TAP.2016.2547023
10.1109/TAP.2011.2173109
10.1109/TIT.2005.858979
10.1109/TAP.2014.2379911
10.1109/LAWP.2013.2270931
10.1007/BF01475864
10.1016/j.crma.2008.03.014
10.1109/TAP.2012.2207344
10.1109/TIT.2006.885507
10.1109/TAP.2004.842656
10.1109/MAP.2014.6837061
10.1007/978-94-015-8032-8
10.1109/TAP.2011.2144556
10.1109/TAP.2016.2562669
10.1109/TAP.2007.891557
10.1109/CISS.2010.5464880
10.1109/8.1192
10.1109/MAP.2008.4653709
10.1007/978-0-387-92920-0_6
10.1109/8.774136
10.1109/LAWP.2009.2019108
10.1109/TIT.2006.871582
10.1155/2013/627410
10.1109/LAWP.2014.2374605
10.1163/156939300X01571
ContentType Journal Article
Copyright Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2018
Copyright_xml – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2018
DBID 97E
RIA
RIE
AAYXX
CITATION
7SP
8FD
L7M
DOI 10.1109/LAWP.2018.2841650
DatabaseName IEEE Xplore (IEEE)
IEEE All-Society Periodicals Package (ASPP) 1998-Present
IEEE/IET Electronic Library
CrossRef
Electronics & Communications Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
DatabaseTitle CrossRef
Technology Research Database
Advanced Technologies Database with Aerospace
Electronics & Communications Abstracts
DatabaseTitleList Technology Research Database

Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISSN 1548-5757
EndPage 1265
ExternalDocumentID 10_1109_LAWP_2018_2841650
8368059
Genre orig-research
GrantInformation_xml – fundername: Short-term Visiting Abroad Programme for Doctoral Candidates of Harbin Institute of Technology
  grantid: AUDQ9802200116
GroupedDBID -~X
0R~
29I
4.4
5GY
5VS
6IK
97E
AAJGR
AARMG
AASAJ
AAWTH
ABAZT
ABQJQ
ABVLG
ACGFO
ACIWK
AENEX
AETIX
AGQYO
AGSQL
AHBIQ
AIBXA
AKJIK
AKQYR
ALMA_UNASSIGNED_HOLDINGS
ATWAV
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CS3
DU5
EBS
EJD
HZ~
IFIPE
IPLJI
JAVBF
LAI
M43
O9-
OCL
P2P
RIA
RIE
RNS
AAYXX
CITATION
7SP
8FD
L7M
RIG
ID FETCH-LOGICAL-c293t-9d9f7e2d96f80b773c94d9ab05b0cd18cae6d4617c9de4671aa6ec174f698e2c3
IEDL.DBID RIE
ISICitedReferencesCount 28
ISICitedReferencesURI http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000437873600030&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
ISSN 1536-1225
IngestDate Mon Jun 30 10:23:56 EDT 2025
Tue Nov 18 21:02:36 EST 2025
Sat Nov 29 02:08:05 EST 2025
Wed Aug 27 02:49:38 EDT 2025
IsPeerReviewed false
IsScholarly true
Issue 7
Language English
License https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c293t-9d9f7e2d96f80b773c94d9ab05b0cd18cae6d4617c9de4671aa6ec174f698e2c3
Notes ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
ORCID 0000-0001-9144-1108
0000-0001-9325-2933
PQID 2064268717
PQPubID 75732
PageCount 5
ParticipantIDs crossref_citationtrail_10_1109_LAWP_2018_2841650
ieee_primary_8368059
proquest_journals_2064268717
crossref_primary_10_1109_LAWP_2018_2841650
PublicationCentury 2000
PublicationDate 2018-07-01
PublicationDateYYYYMMDD 2018-07-01
PublicationDate_xml – month: 07
  year: 2018
  text: 2018-07-01
  day: 01
PublicationDecade 2010
PublicationPlace New York
PublicationPlace_xml – name: New York
PublicationTitle IEEE antennas and wireless propagation letters
PublicationTitleAbbrev LAWP
PublicationYear 2018
Publisher IEEE
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher_xml – name: IEEE
– name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
References ref13
ref12
ref15
ref14
ref11
ref10
ref2
ref1
ref17
ref16
ref19
ref18
ref24
ref23
ref26
ref25
ref20
ref22
ref21
ref8
ref7
ref9
ref4
ref3
ref6
ref5
References_xml – ident: ref15
  doi: 10.1109/TAP.2016.2547023
– ident: ref12
  doi: 10.1109/TAP.2011.2173109
– ident: ref23
  doi: 10.1109/TIT.2005.858979
– ident: ref17
  doi: 10.1109/TAP.2014.2379911
– ident: ref16
  doi: 10.1109/LAWP.2013.2270931
– ident: ref24
  doi: 10.1007/BF01475864
– ident: ref20
  doi: 10.1016/j.crma.2008.03.014
– ident: ref10
  doi: 10.1109/TAP.2012.2207344
– ident: ref19
  doi: 10.1109/TIT.2006.885507
– ident: ref2
  doi: 10.1109/TAP.2004.842656
– ident: ref18
  doi: 10.1109/MAP.2014.6837061
– ident: ref25
  doi: 10.1007/978-94-015-8032-8
– ident: ref9
  doi: 10.1109/TAP.2011.2144556
– ident: ref13
  doi: 10.1109/TAP.2016.2562669
– ident: ref3
  doi: 10.1109/TAP.2007.891557
– ident: ref26
  doi: 10.1109/CISS.2010.5464880
– ident: ref8
  doi: 10.1109/TAP.2011.2173109
– ident: ref1
  doi: 10.1109/8.1192
– ident: ref4
  doi: 10.1109/MAP.2008.4653709
– ident: ref22
  doi: 10.1007/978-0-387-92920-0_6
– ident: ref5
  doi: 10.1109/8.774136
– ident: ref7
  doi: 10.1109/LAWP.2009.2019108
– ident: ref21
  doi: 10.1109/TIT.2006.871582
– ident: ref14
  doi: 10.1155/2013/627410
– ident: ref11
  doi: 10.1109/LAWP.2014.2374605
– ident: ref6
  doi: 10.1163/156939300X01571
SSID ssj0017653
Score 2.3555217
Snippet A deterministic sampling strategy for failure identification in uniform linear arrays using compressed sensing/sparse recovery technique is proposed. Numerical...
SourceID proquest
crossref
ieee
SourceType Aggregation Database
Enrichment Source
Index Database
Publisher
StartPage 1261
SubjectTerms Antenna arrays
Antenna measurements
array antennas
Arrays
compressed sensing (CS)
fault diagnosis
Indexes
Linear arrays
Linear matrix inequalities
Random sampling
Recovery
Sampling techniques
Sensors
Sparse matrices
Strategy
Title A Deterministic Far-Field Sampling Strategy for Array Diagnosis Using Sparse Recovery
URI https://ieeexplore.ieee.org/document/8368059
https://www.proquest.com/docview/2064268717
Volume 17
WOSCitedRecordID wos000437873600030&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
journalDatabaseRights – providerCode: PRVIEE
  databaseName: IEEE Electronic Library (IEL)
  customDbUrl:
  eissn: 1548-5757
  dateEnd: 99991231
  omitProxy: false
  ssIdentifier: ssj0017653
  issn: 1536-1225
  databaseCode: RIE
  dateStart: 20020101
  isFulltext: true
  titleUrlDefault: https://ieeexplore.ieee.org/
  providerName: IEEE
link http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LS8QwEB508aAH3-L6IgdPYrWvzeO4qMWDLIKK3kpeFUG60l2F_fdO0mxZUARvPSQhzCQz83W-zACcDhJb8UTqKDaZQYBS8UimkkUVU1ylRqVppXyzCTYa8ZcXcb8E591bGGutJ5_ZC_fpc_lmrD_dr7JLnlGO4cAyLDNG27daXcaAUV9xEi-w6yuTDkIGM4nF5d3w-d6RuPhF6pJs7on9gg_yTVV-WGLvXoqN_21sE9ZDGEmGrd63YMnW27C2UFxwB56G5DpwXXwxZlLIJiocYY08SMcjr19JqE07Ixi64mKNnJHrlnv3NiGeTUAePhD6WuJgKp762S48FTePV7dRaKIQafTk00gYUTGbGkErHivGMi1yI6SKByrWJuFaWmpyjGO0MBatZiIltRpxSkUFt6nO9qBXj2u7DyTOM40mAX1dYnOEOUpVSmo2yFWGJ0HmfYjnYi11qDDuGl28lx5pxKJ0miidJsqgiT6cdVM-2vIafw3ecaLvBgap9-ForrsyXMAJzkNgRRENsoPfZx3Cqlu7Zd4eQW_afNpjWNFf07dJc-LP1jf4Gcyv
linkProvider IEEE
linkToHtml http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LTxsxEB6lFKlwaKEUEUqLD5xQF7zeh-1jBERUDRFSEjW3lV9bIaEQ5VEp_75jr4kiUSFx24PtXc3YM_PtfJ4BOCtSV4tUmYTazCJAqUWimOJJzbXQzGrGah2aTfB-X4zH8r4FP9Z3YZxzgXzmLvxjyOXbJ7P0v8ouRVYKDAfewfsizxltbmutcwa8DDUn8Qj7zjKsiDnMlMrLXuf3vadxiQvm02z-kv2GFwptVV7Y4uBgup_e9ml78DEGkqTTaH4fWm7yGXY3ygsewKhDriPbJZRjJl01S7qeskYGyjPJJ39IrE67Ihi84mIztSLXDfvuYU4Cn4AMpgh-HfFAFff96guMujfDq9sktlFIDPryRSKtrLljVpa1oJrzzMjcSqVpoamxqTDKlTbHSMZI69BupkqVziBSqUspHDPZIWxNnibuCAjNM4NGAb1d6nIEOlrXWhle5DrDvaDyNtBnsVYm1hj3rS4eq4A1qKy8JiqviSpqog3n6ynTpsDGa4MPvOjXA6PU23DyrLsqHsE5zkNoVSIe5Mf_n3UKH26Hd72q97P_6yvs-Pc0PNwT2FrMlu4bbJu_i4f57HvYZ_8Ax8jP9g
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=A+Deterministic+Far-Field+Sampling+Strategy+for+Array+Diagnosis+Using+Sparse+Recovery&rft.jtitle=IEEE+antennas+and+wireless+propagation+letters&rft.au=Li%2C+Wei&rft.au=Deng%2C+Weibo&rft.au=Migliore%2C+Marco+Donald&rft.date=2018-07-01&rft.pub=The+Institute+of+Electrical+and+Electronics+Engineers%2C+Inc.+%28IEEE%29&rft.issn=1536-1225&rft.eissn=1548-5757&rft.volume=17&rft.issue=7&rft.spage=1261&rft_id=info:doi/10.1109%2FLAWP.2018.2841650&rft.externalDBID=NO_FULL_TEXT
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1536-1225&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1536-1225&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1536-1225&client=summon