Demystifying and Mitigating Code-Dependent Switching Distortions in Current-Steering DACs

This paper analyzes the intermodulation between the element transition rate and the output-dependent unit switching distortion, i.e., the switching distortion of one switching unit, in current-steering digital-to-analog converters (DACs). The analysis and experimental results reveal how this intermo...

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Vydáno v:IEEE transactions on circuits and systems. I, Regular papers Ročník 66; číslo 1; s. 68 - 81
Hlavní autoři: Lai, Longqiang, Li, Xueqing, Fu, Yushen, Liu, Yongpan, Yang, Huazhong
Médium: Journal Article
Jazyk:angličtina
Vydáno: New York IEEE 01.01.2019
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Témata:
Analytical models
CMOS
Current-steering
Decoding
Digital to analog conversion
Digital to analog converters
digital-to-analog converter (DAC)
Distortion
dynamic element matching (DEM)
element transition rate
Intermodulation
Intermodulation distortion
Linearity
Steering
Switches
Switching
switching distortion
ISSN:1549-8328, 1558-0806
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Shrnutí:This paper analyzes the intermodulation between the element transition rate and the output-dependent unit switching distortion, i.e., the switching distortion of one switching unit, in current-steering digital-to-analog converters (DACs). The analysis and experimental results reveal how this intermodulation affects the DAC linearity. Based on this, we also propose a technique, termed random pairwise swapping (RPS) to improve the linearity of dynamic-element-matching-decoded DACs. Compared with existing techniques, RPS needs no half-cycle RZ operations and, thus, has no related vulnerabilities. In addition, the RPS could deal with the mismatch between different channels effectively. A 14-bit experimental DAC is fabricated in a 65-nm CMOS process. Measured results at 1.0-GS/s show above 72-dBc SFDR within 422-MHz band-width and 8-10-dB image tone suppression by the proposed RPS technique. At 3.0 GS/s, the SFDR is over 60 dBc within 600-MHz bandwidth.
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ISSN:1549-8328
1558-0806
DOI:10.1109/TCSI.2018.2866819