A Predictive Algorithm for Crosstalk Peaks of SiC MOSFET by Considering the Nonlinearity of Gate-Drain Capacitance

A predictive algorithm for accurately determining the crosstalk peaks caused by SiC MOSFET s is proposed in this article, which is very important to better design the drive and protect circuits of SiC MOSFET s. Compared to the conventional algorithm of crosstalk peaks, the nonlinearity of gate-drain...

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Bibliographic Details
Published in:IEEE transactions on power electronics Vol. 36; no. 3; pp. 2823 - 2834
Main Authors: Li, Hong, Jiang, Yanfeng, Qiu, Zhidong, Wang, Yuting, Ding, Yuhang
Format: Journal Article
Language:English
Published: New York IEEE 01.03.2021
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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ISSN:0885-8993, 1941-0107
Online Access:Get full text
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