Wei, B., Tian, E., Zhang, T., & Zhao, X. (2021). Probabilistic-Constrained H∞ Tracking Control for a Class of Stochastic Nonlinear Systems Subject to DoS Attacks and Measurement Outliers. IEEE transactions on circuits and systems. I, Regular papers, 68(10), 4381-4392. https://doi.org/10.1109/TCSI.2021.3097824
Chicago-Zitierstil (17. Ausg.)Wei, Bin, Engang Tian, Tao Zhang, und Xia Zhao. "Probabilistic-Constrained H∞ Tracking Control for a Class of Stochastic Nonlinear Systems Subject to DoS Attacks and Measurement Outliers." IEEE Transactions on Circuits and Systems. I, Regular Papers 68, no. 10 (2021): 4381-4392. https://doi.org/10.1109/TCSI.2021.3097824.
MLA-Zitierstil (9. Ausg.)Wei, Bin, et al. "Probabilistic-Constrained H∞ Tracking Control for a Class of Stochastic Nonlinear Systems Subject to DoS Attacks and Measurement Outliers." IEEE Transactions on Circuits and Systems. I, Regular Papers, vol. 68, no. 10, 2021, pp. 4381-4392, https://doi.org/10.1109/TCSI.2021.3097824.