L- and LCL-Filtered Grid-Tied Single-Phase Inverter Transistor Open-Circuit Fault Diagnosis Based on Post-Fault Reconfiguration Algorithms
This paper presents a transistor open-circuit fault diagnosis method based on an average model and post-fault reconfiguration algorithms for a grid-tied single-phase inverter that transfers power bi-directionally. The transistor open-circuit fault occurrence is detected by comparing the average brid...
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| Published in: | IEEE transactions on power electronics Vol. 34; no. 10; pp. 10180 - 10192 |
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| Main Authors: | , , , , , |
| Format: | Journal Article |
| Language: | English |
| Published: |
New York
IEEE
01.10.2019
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
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| ISSN: | 0885-8993, 1941-0107 |
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| Abstract | This paper presents a transistor open-circuit fault diagnosis method based on an average model and post-fault reconfiguration algorithms for a grid-tied single-phase inverter that transfers power bi-directionally. The transistor open-circuit fault occurrence is detected by comparing the average bridge arm pole-to-pole voltage deviation and threshold first. Then, the exact faulty transistor is identified by developed algorithms based on post-fault reconfiguration of control (PFRC) and of utilizing redundant leg (PFRUR). These two fault identification algorithms are suitable for different situations. Compared with the PFRUR, the PFRC can identify the faulty transistor without the help of redundant leg, but the identification time is longer. For inverters equipped with redundant leg already, the PFRUR can achieve faster identification speed so that inverters in reliability-oriented applications can return to normal operation after fault with short interruption. With average model, this method only requires existing signals sampled for control, thus it can be embedded in system easily without adding extra sensors and diagnosis circuits. The sampling frequency can be as low as switching frequency. Furthermore, this method is suitable for both inverters with L or LCL filters. Finally, experiments are carried out on a 550-W/10-kHz grid-tied single-phase inverter to verify the effectiveness. |
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| AbstractList | This paper presents a transistor open-circuit fault diagnosis method based on an average model and post-fault reconfiguration algorithms for a grid-tied single-phase inverter that transfers power bi-directionally. The transistor open-circuit fault occurrence is detected by comparing the average bridge arm pole-to-pole voltage deviation and threshold first. Then, the exact faulty transistor is identified by developed algorithms based on post-fault reconfiguration of control (PFRC) and of utilizing redundant leg (PFRUR). These two fault identification algorithms are suitable for different situations. Compared with the PFRUR, the PFRC can identify the faulty transistor without the help of redundant leg, but the identification time is longer. For inverters equipped with redundant leg already, the PFRUR can achieve faster identification speed so that inverters in reliability-oriented applications can return to normal operation after fault with short interruption. With average model, this method only requires existing signals sampled for control, thus it can be embedded in system easily without adding extra sensors and diagnosis circuits. The sampling frequency can be as low as switching frequency. Furthermore, this method is suitable for both inverters with L or LCL filters. Finally, experiments are carried out on a 550-W/10-kHz grid-tied single-phase inverter to verify the effectiveness. |
| Author | Wang, Borong Bai, Zhihong Ren, Yini Wang, Jun Li, Zhan Ma, Hao |
| Author_xml | – sequence: 1 givenname: Zhan orcidid: 0000-0002-5053-6853 surname: Li fullname: Li, Zhan email: lizhan@zju.edu.cn organization: Institute of Power Electronics, College of Electrical Engineering, Zhejiang University, Hangzhou, China – sequence: 2 givenname: Borong orcidid: 0000-0003-4271-4995 surname: Wang fullname: Wang, Borong email: borongw@126.com organization: Institute of Power Electronics, College of Electrical Engineering, Zhejiang University, Hangzhou, China – sequence: 3 givenname: Yini surname: Ren fullname: Ren, Yini email: 3130101062@zju.edu.cn organization: Institute of Power Electronics, College of Electrical Engineering, Zhejiang University, Hangzhou, China – sequence: 4 givenname: Jun orcidid: 0000-0002-2308-5575 surname: Wang fullname: Wang, Jun email: wjun_ee@163.com organization: Institute of Power Electronics, College of Electrical Engineering, Zhejiang University, Hangzhou, China – sequence: 5 givenname: Zhihong surname: Bai fullname: Bai, Zhihong email: bai_zhihong@126.com organization: Institute of Power Electronics, College of Electrical Engineering, Zhejiang University, Hangzhou, China – sequence: 6 givenname: Hao orcidid: 0000-0002-4714-0233 surname: Ma fullname: Ma, Hao email: mahao@zju.edu.cn organization: Institute of Power Electronics, College of Electrical Engineering, Zhejiang University, Hangzhou, China |
| BookMark | eNp9kEFPGzEQhS1EJQLlByAulnp26rF3s_aRpoQirUTUhvPK650Eo8VObS8Sf6G_uk6Deuihpxnpve_N6J2TUx88EnIFfA7A9efN-radCw56LpQGUekTMgNdAePAm1My40rVTGktz8h5Ss-cQ1VzmJFfLaPGD7RdtmzlxowRB3oX3cA2rmw_nN-NyNZPJiG9968Yi4NuovHJpRwifdijZ0sX7eQyXZlpzPSrMzsfik6_FGqgwdN1SJkd1e9og9-63RRNdkW6GXchuvz0kj6SD1szJrx8nxfkcXW7WX5j7cPd_fKmZVZomZm0Td0v1AC9WRhb12gGIaGBStey6q22qjGorawUX_S2abhVHLdyqAGB99LIC_LpmLuP4eeEKXfPYYq-nOyEKBl1I0AUV3N02RhSirjtrMt_Xs7RuLED3h2K7w7Fd4fiu_fiCwn_kPvoXkx8-y9zfWQcIv71qwWvuBbyN5wjkWY |
| CODEN | ITPEE8 |
| CitedBy_id | crossref_primary_10_1016_j_measurement_2024_114864 crossref_primary_10_1109_TPEL_2019_2946692 crossref_primary_10_1109_TPEL_2021_3087488 crossref_primary_10_1109_TPEL_2025_3552380 crossref_primary_10_1109_TIE_2022_3186357 crossref_primary_10_3390_electronics13030502 crossref_primary_10_1016_j_compeleceng_2021_107481 crossref_primary_10_1109_TPEL_2021_3134712 crossref_primary_10_1109_TIE_2024_3382977 crossref_primary_10_1007_s00202_023_01989_y crossref_primary_10_1109_JSEN_2021_3120887 crossref_primary_10_1016_j_fusengdes_2020_112076 crossref_primary_10_1109_TPEL_2023_3265188 crossref_primary_10_3390_en18143855 crossref_primary_10_1109_TIE_2024_3390715 crossref_primary_10_1109_TPEL_2022_3232191 |
| Cites_doi | 10.1109/TPEL.2012.2197866 10.1109/TPEL.2014.2304561 10.1049/el.2015.1194 10.1109/TPEL.2013.2257862 10.1109/IEMDC.2011.5994739 10.1109/TIE.2010.2040552 10.1109/TIE.2010.2051939 10.1109/TTE.2016.2584921 10.1109/TPEL.2015.2465299 10.1016/j.isatra.2011.10.012 10.1109/TPEL.2014.2373390 10.6113/JPE.2016.16.3.1087 10.1109/TIE.2010.2098355 10.1109/TIE.2014.2364154 10.1109/TIA.2013.2266392 10.2991/ipemec-15.2015.64 10.1109/TIE.2016.2535960 10.1109/TIA.2011.2124436 10.1109/TIE.2004.825284 10.1016/j.epsr.2015.05.001 10.1049/iet-epa.2011.0315 10.1109/TPEL.2010.2052472 10.1109/TPEL.2003.809351 10.1109/TPEL.2010.2049377 10.1109/JESTPE.2017.2687126 10.1109/TPEL.2017.2773130 10.1109/TIE.2015.2420627 10.1109/TIA.2009.2027535 |
| ContentType | Journal Article |
| Copyright | Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2019 |
| Copyright_xml | – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2019 |
| DBID | 97E RIA RIE AAYXX CITATION 7SP 7TB 8FD FR3 JQ2 KR7 L7M |
| DOI | 10.1109/TPEL.2019.2891249 |
| DatabaseName | IEEE All-Society Periodicals Package (ASPP) 2005-present IEEE All-Society Periodicals Package (ASPP) 1998-Present IEEE Electronic Library (IEL) CrossRef Electronics & Communications Abstracts Mechanical & Transportation Engineering Abstracts Technology Research Database Engineering Research Database ProQuest Computer Science Collection Civil Engineering Abstracts Advanced Technologies Database with Aerospace |
| DatabaseTitle | CrossRef Civil Engineering Abstracts Technology Research Database Mechanical & Transportation Engineering Abstracts Electronics & Communications Abstracts ProQuest Computer Science Collection Engineering Research Database Advanced Technologies Database with Aerospace |
| DatabaseTitleList | Civil Engineering Abstracts |
| Database_xml | – sequence: 1 dbid: RIE name: IEEE/IET Electronic Library (IEL) url: https://ieeexplore.ieee.org/ sourceTypes: Publisher |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Engineering |
| EISSN | 1941-0107 |
| EndPage | 10192 |
| ExternalDocumentID | 10_1109_TPEL_2019_2891249 8604092 |
| Genre | orig-research |
| GrantInformation_xml | – fundername: National Natural Science Foundation of China; National Nature Science Foundation of China grantid: 51337009 funderid: 10.13039/501100001809 |
| GroupedDBID | -~X 0R~ 29I 3EH 4.4 5GY 5VS 6IK 97E AAJGR AARMG AASAJ AAWTH ABAZT ABFSI ABQJQ ABVLG ACGFO ACGFS ACIWK ACKIV AENEX AETIX AGQYO AGSQL AHBIQ AI. AIBXA AKJIK AKQYR ALLEH ALMA_UNASSIGNED_HOLDINGS ASUFR ATWAV BEFXN BFFAM BGNUA BKEBE BKOMP BPEOZ CS3 DU5 E.L EBS EJD HZ~ H~9 ICLAB IFIPE IFJZH IPLJI JAVBF LAI M43 MS~ O9- OCL P2P PQQKQ RIA RIE RNS RXW TAE TAF TN5 VH1 VJK AAYXX CITATION 7SP 7TB 8FD FR3 JQ2 KR7 L7M RIG |
| ID | FETCH-LOGICAL-c293t-3c75b68d1ba6ac55ead2317149534bc9c87ae9c34806bc770c80ef3d51e10b3a3 |
| IEDL.DBID | RIE |
| ISICitedReferencesCount | 21 |
| ISICitedReferencesURI | http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000474581900068&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D |
| ISSN | 0885-8993 |
| IngestDate | Mon Jun 30 04:46:45 EDT 2025 Sat Nov 29 03:54:34 EST 2025 Tue Nov 18 22:32:09 EST 2025 Wed Aug 27 08:32:27 EDT 2025 |
| IsPeerReviewed | true |
| IsScholarly | true |
| Issue | 10 |
| Language | English |
| License | https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html https://doi.org/10.15223/policy-029 https://doi.org/10.15223/policy-037 |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-LOGICAL-c293t-3c75b68d1ba6ac55ead2317149534bc9c87ae9c34806bc770c80ef3d51e10b3a3 |
| Notes | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 |
| ORCID | 0000-0002-5053-6853 0000-0003-4271-4995 0000-0002-4714-0233 0000-0002-2308-5575 |
| PQID | 2253457212 |
| PQPubID | 37080 |
| PageCount | 13 |
| ParticipantIDs | crossref_citationtrail_10_1109_TPEL_2019_2891249 ieee_primary_8604092 crossref_primary_10_1109_TPEL_2019_2891249 proquest_journals_2253457212 |
| PublicationCentury | 2000 |
| PublicationDate | 2019-10-01 |
| PublicationDateYYYYMMDD | 2019-10-01 |
| PublicationDate_xml | – month: 10 year: 2019 text: 2019-10-01 day: 01 |
| PublicationDecade | 2010 |
| PublicationPlace | New York |
| PublicationPlace_xml | – name: New York |
| PublicationTitle | IEEE transactions on power electronics |
| PublicationTitleAbbrev | TPEL |
| PublicationYear | 2019 |
| Publisher | IEEE The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher_xml | – name: IEEE – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| References | ref13 ref12 ref15 lu (ref9) 2009; 45 ref14 ref11 ref10 ref2 (ref29) 2017 ref1 ref17 ref16 ref19 ref18 de (ref6) 2004; 51 ref24 ref23 ref26 ref25 ref20 ref22 ref21 (ref30) 2018 ref28 ref27 ref8 ref7 ref4 ref3 ref5 |
| References_xml | – ident: ref1 doi: 10.1109/TPEL.2012.2197866 – ident: ref7 doi: 10.1109/TPEL.2014.2304561 – ident: ref24 doi: 10.1049/el.2015.1194 – ident: ref25 doi: 10.1109/TPEL.2013.2257862 – ident: ref21 doi: 10.1109/IEMDC.2011.5994739 – year: 2017 ident: ref29 – ident: ref27 doi: 10.1109/TIE.2010.2040552 – ident: ref19 doi: 10.1109/TIE.2010.2051939 – ident: ref3 doi: 10.1109/TTE.2016.2584921 – ident: ref26 doi: 10.1109/TPEL.2015.2465299 – ident: ref16 doi: 10.1016/j.isatra.2011.10.012 – ident: ref10 doi: 10.1109/TPEL.2014.2373390 – ident: ref14 doi: 10.6113/JPE.2016.16.3.1087 – ident: ref17 doi: 10.1109/TIE.2010.2098355 – ident: ref18 doi: 10.1109/TIE.2014.2364154 – ident: ref2 doi: 10.1109/TIA.2013.2266392 – ident: ref20 doi: 10.2991/ipemec-15.2015.64 – ident: ref15 doi: 10.1109/TIE.2016.2535960 – ident: ref4 doi: 10.1109/TIA.2011.2124436 – volume: 51 start-page: 439 year: 2004 ident: ref6 article-title: Fault-tolerant voltage-fed PWM inverter AC motor drive systems publication-title: IEEE Trans Ind Electron doi: 10.1109/TIE.2004.825284 – ident: ref23 doi: 10.1016/j.epsr.2015.05.001 – ident: ref12 doi: 10.1049/iet-epa.2011.0315 – ident: ref13 doi: 10.1109/TPEL.2010.2052472 – ident: ref11 doi: 10.1109/TPEL.2003.809351 – ident: ref5 doi: 10.1109/TPEL.2010.2049377 – ident: ref8 doi: 10.1109/JESTPE.2017.2687126 – ident: ref28 doi: 10.1109/TPEL.2017.2773130 – ident: ref22 doi: 10.1109/TIE.2015.2420627 – year: 2018 ident: ref30 – volume: 45 start-page: 1770 year: 2009 ident: ref9 article-title: A literature review of IGBT fault diagnostic and protection methods for power inverters publication-title: IEEE Trans Ind Appl doi: 10.1109/TIA.2009.2027535 |
| SSID | ssj0014501 |
| Score | 2.4126818 |
| Snippet | This paper presents a transistor open-circuit fault diagnosis method based on an average model and post-fault reconfiguration algorithms for a grid-tied... |
| SourceID | proquest crossref ieee |
| SourceType | Aggregation Database Enrichment Source Index Database Publisher |
| StartPage | 10180 |
| SubjectTerms | Algorithms Average model Circuit faults Circuits Embedded systems Fault detection Fault diagnosis grid-tied single-phase inverter Inverters Legged locomotion post-fault reconfiguration Reconfiguration Redundancy Sensors Transistors |
| Title | L- and LCL-Filtered Grid-Tied Single-Phase Inverter Transistor Open-Circuit Fault Diagnosis Based on Post-Fault Reconfiguration Algorithms |
| URI | https://ieeexplore.ieee.org/document/8604092 https://www.proquest.com/docview/2253457212 |
| Volume | 34 |
| WOSCitedRecordID | wos000474581900068&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| journalDatabaseRights | – providerCode: PRVIEE databaseName: IEEE/IET Electronic Library (IEL) customDbUrl: eissn: 1941-0107 dateEnd: 99991231 omitProxy: false ssIdentifier: ssj0014501 issn: 0885-8993 databaseCode: RIE dateStart: 19860101 isFulltext: true titleUrlDefault: https://ieeexplore.ieee.org/ providerName: IEEE |
| link | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1NT9wwELUo4tAeoJRW3QKVD5wqDM46juMjXdhyWKGVukjcIn9MINI2i7IJP4Jf3bETVq1aVeotUmwr0ht7ZjLP8wg5sRIUZOWYicxZhh7CsHzsU6YVqCTxuuS5j2IT6uYmv7vT8y1yurkLAwCRfAZn4THW8v3KdeFX2XmeoclpPHBfKaX6u1qbikEqo9QxbhrJMIcQQwUz4fp8Mb-aBRKXPsPsIogt_-aDoqjKHydxdC_Tvf_7sLdkdwgj6UWP-z7ZgvodefNLc8ED8jxj1NSeziYzNq1CURw8_dZUni0w7KTfcdAS2PwB3RgN3TYCt5NG1xU7h9BANWGTqnFd1dKp6ZYtvex5edWafsVZnq5qGsR-Wf82ZLJ1Wd13vVHRi-X9qqnahx_r9-R2erWYXLNBeYE5dP8tE05Jm-U-sSYzTko0N4wDVSSjptZplysD2ok055l1SnGXcyiFlwkk3AojPpDtelXDR0KFC_12DPde2tQCNxmMpS2FQOeMoZccEf6CReGGtuRBHWNZxPSE6yLAVwT4igG-EfmymfLY9-T41-CDgNdm4ADViBy9AF4Mu3Zd4NkmUok58fjT32cdktdh7Z7Md0S226aDY7Ljntpq3XyOBvkT3a_elg |
| linkProvider | IEEE |
| linkToHtml | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1NT9wwELUQrdT2UEpp1W0p-NBTVYMTx3F8hIUFRFit1K3ELfJXINI2i7IJP6K_umMnrKhaVeIWKbYc6Y09M5nneQh90dwJl5YxYanRBDyEIllsEyKFE1FkZUkzG8QmxHSaXV_L2Qb6tr4L45wL5DN34B9DLd8uTed_lR1mKZichAP3GU-SOOpva61rBgkPYsewbTiBLIINNcyIysP57DT3NC55APmFl1v-wwsFWZW_zuLgYCZbT_u0N-j1EEjiox75bbTh6rfo1aP2gjvoV06wqi3OxzmZVL4s7iw-aypL5hB44u8waOHI7BYcGfb9Njy7EwfnFXqHYE82IeOqMV3V4onqFi0-6Zl51QofwyyLlzX2cr-kf-tz2bqsbrrerPDR4mbZVO3tz9U79GNyOh-fk0F7gRgIAFrCjOA6zWykVaoM52BwEAmKQEdNtJEmE8pJw5KMptoIQU1GXcksj1xENVPsPdqsl7X7gDAzvuOOotZynWhHVepirkvGwD1D8MVHiD5gUZihMbnXx1gUIUGhsvDwFR6-YoBvhL6up9z1XTn-N3jH47UeOEA1QrsPgBfDvl0VcLqxhENWHH_896x99OJ8fpUX-cX08hN66dfpqX27aLNtOvcZPTf3bbVq9oJx_gaWYOHd |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=L-+and+LCL+-Filtered+Grid-Tied+Single-Phase+Inverter+Transistor+Open-Circuit+Fault+Diagnosis+Based+on+Post-Fault+Reconfiguration+Algorithms&rft.jtitle=IEEE+transactions+on+power+electronics&rft.au=Li%2C+Zhan&rft.au=Wang%2C+Borong&rft.au=Ren%2C+Yini&rft.au=Wang%2C+Jun&rft.date=2019-10-01&rft.issn=0885-8993&rft.eissn=1941-0107&rft.volume=34&rft.issue=10&rft.spage=10180&rft.epage=10192&rft_id=info:doi/10.1109%2FTPEL.2019.2891249&rft.externalDBID=n%2Fa&rft.externalDocID=10_1109_TPEL_2019_2891249 |
| thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0885-8993&client=summon |
| thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0885-8993&client=summon |
| thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0885-8993&client=summon |