Li, Z., Wang, B., Ren, Y., Wang, J., Bai, Z., & Ma, H. (2019). L- and LCL-Filtered Grid-Tied Single-Phase Inverter Transistor Open-Circuit Fault Diagnosis Based on Post-Fault Reconfiguration Algorithms. IEEE transactions on power electronics, 34(10), 10180-10192. https://doi.org/10.1109/TPEL.2019.2891249
Chicago Style (17th ed.) CitationLi, Zhan, Borong Wang, Yini Ren, Jun Wang, Zhihong Bai, and Hao Ma. "L- and LCL-Filtered Grid-Tied Single-Phase Inverter Transistor Open-Circuit Fault Diagnosis Based on Post-Fault Reconfiguration Algorithms." IEEE Transactions on Power Electronics 34, no. 10 (2019): 10180-10192. https://doi.org/10.1109/TPEL.2019.2891249.
MLA (9th ed.) CitationLi, Zhan, et al. "L- and LCL-Filtered Grid-Tied Single-Phase Inverter Transistor Open-Circuit Fault Diagnosis Based on Post-Fault Reconfiguration Algorithms." IEEE Transactions on Power Electronics, vol. 34, no. 10, 2019, pp. 10180-10192, https://doi.org/10.1109/TPEL.2019.2891249.