Generative Adversarial Active Learning for Unsupervised Outlier Detection

Outlier detection is an important topic in machine learning and has been used in a wide range of applications. In this paper, we approach outlier detection as a binary-classification issue by sampling potential outliers from a uniform reference distribution. However, due to the sparsity of data in h...

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Veröffentlicht in:IEEE transactions on knowledge and data engineering Jg. 32; H. 8; S. 1517 - 1528
Hauptverfasser: Liu, Yezheng, Li, Zhe, Zhou, Chong, Jiang, Yuanchun, Sun, Jianshan, Wang, Meng, He, Xiangnan
Format: Journal Article
Sprache:Englisch
Veröffentlicht: New York IEEE 01.08.2020
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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ISSN:1041-4347, 1558-2191
Online-Zugang:Volltext
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