Zhou, X., Xu, B., Kim, K., Han, D., Nguyen, H. H., Le-Cong, T., . . . Lo, D. (2024). Leveraging Large Language Model for Automatic Patch Correctness Assessment. IEEE transactions on software engineering, 50(11), 2865-2883. https://doi.org/10.1109/TSE.2024.3452252
Citace podle Chicago (17th ed.)Zhou, Xin, Bowen Xu, Kisub Kim, DongGyun Han, Hung Huu Nguyen, Thanh Le-Cong, Junda He, Bach Le, a David Lo. "Leveraging Large Language Model for Automatic Patch Correctness Assessment." IEEE Transactions on Software Engineering 50, no. 11 (2024): 2865-2883. https://doi.org/10.1109/TSE.2024.3452252.
Citace podle MLA (9th ed.)Zhou, Xin, et al. "Leveraging Large Language Model for Automatic Patch Correctness Assessment." IEEE Transactions on Software Engineering, vol. 50, no. 11, 2024, pp. 2865-2883, https://doi.org/10.1109/TSE.2024.3452252.