Chien, C., & Suwattananuruk, B. (2024). Density-Based Spatial Clustering of Applications With Noise (DBSCAN) for Probe Card Production for Advanced Quality Control of Wafer Probing Test. IEEE transactions on semiconductor manufacturing, 37(4), 567-575. https://doi.org/10.1109/TSM.2024.3468000
Citácia podle Chicago (17th ed.)Chien, Chen-Fu, a Butsayarin Suwattananuruk. "Density-Based Spatial Clustering of Applications With Noise (DBSCAN) for Probe Card Production for Advanced Quality Control of Wafer Probing Test." IEEE Transactions on Semiconductor Manufacturing 37, no. 4 (2024): 567-575. https://doi.org/10.1109/TSM.2024.3468000.
Citácia podľa MLA (8th ed.)Chien, Chen-Fu, a Butsayarin Suwattananuruk. "Density-Based Spatial Clustering of Applications With Noise (DBSCAN) for Probe Card Production for Advanced Quality Control of Wafer Probing Test." IEEE Transactions on Semiconductor Manufacturing, vol. 37, no. 4, 2024, pp. 567-575, https://doi.org/10.1109/TSM.2024.3468000.