APA (7th ed.) Citation

Chien, C., & Suwattananuruk, B. (2024). Density-Based Spatial Clustering of Applications With Noise (DBSCAN) for Probe Card Production for Advanced Quality Control of Wafer Probing Test. IEEE transactions on semiconductor manufacturing, 37(4), 567-575. https://doi.org/10.1109/TSM.2024.3468000

Chicago Style (17th ed.) Citation

Chien, Chen-Fu, and Butsayarin Suwattananuruk. "Density-Based Spatial Clustering of Applications With Noise (DBSCAN) for Probe Card Production for Advanced Quality Control of Wafer Probing Test." IEEE Transactions on Semiconductor Manufacturing 37, no. 4 (2024): 567-575. https://doi.org/10.1109/TSM.2024.3468000.

MLA (9th ed.) Citation

Chien, Chen-Fu, and Butsayarin Suwattananuruk. "Density-Based Spatial Clustering of Applications With Noise (DBSCAN) for Probe Card Production for Advanced Quality Control of Wafer Probing Test." IEEE Transactions on Semiconductor Manufacturing, vol. 37, no. 4, 2024, pp. 567-575, https://doi.org/10.1109/TSM.2024.3468000.