Chien, C., & Suwattananuruk, B. (2024). Density-Based Spatial Clustering of Applications With Noise (DBSCAN) for Probe Card Production for Advanced Quality Control of Wafer Probing Test. IEEE transactions on semiconductor manufacturing, 37(4), 567-575. https://doi.org/10.1109/TSM.2024.3468000
Chicago-Zitierstil (17. Ausg.)Chien, Chen-Fu, und Butsayarin Suwattananuruk. "Density-Based Spatial Clustering of Applications With Noise (DBSCAN) for Probe Card Production for Advanced Quality Control of Wafer Probing Test." IEEE Transactions on Semiconductor Manufacturing 37, no. 4 (2024): 567-575. https://doi.org/10.1109/TSM.2024.3468000.
MLA-Zitierstil (9. Ausg.)Chien, Chen-Fu, und Butsayarin Suwattananuruk. "Density-Based Spatial Clustering of Applications With Noise (DBSCAN) for Probe Card Production for Advanced Quality Control of Wafer Probing Test." IEEE Transactions on Semiconductor Manufacturing, vol. 37, no. 4, 2024, pp. 567-575, https://doi.org/10.1109/TSM.2024.3468000.