Automatic 3-D Measurement Method for Nonuniform Moving Objects
Phase-shifting profilometry (PSP) via sequential fringe projection is applicable for high-accuracy 3-D measurements of static objects. However, moving objects cannot be static or quasi-static during one projection cycle, thereby causing surface misalignment and phase errors in 3-D measurements. This...
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| Vydáno v: | IEEE transactions on instrumentation and measurement Ročník 70; s. 1 - 11 |
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| Médium: | Journal Article |
| Jazyk: | angličtina |
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New York
IEEE
2021
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
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| ISSN: | 0018-9456, 1557-9662 |
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| Abstract | Phase-shifting profilometry (PSP) via sequential fringe projection is applicable for high-accuracy 3-D measurements of static objects. However, moving objects cannot be static or quasi-static during one projection cycle, thereby causing surface misalignment and phase errors in 3-D measurements. This article proposes a motion-estimated PSP based on the fringe-oriented synthetic phase correlation algorithm (FO-SPCA), which achieves automatic 3-D measurements of objects in nonuniform 2-D motion. To robustly estimate the motion of objects among fringe images, the proposed fringe-oriented feature extraction technique obtains the surface features by eliminating the modulation influence of sinusoidal illumination. Furthermore, the FO-SPCA is developed to accurately detect the subpixel displacements of moving objects according to object surface features. With the subpixel displacements, the alignment procedure is completed through a reverse 2-D transformation and then the phase errors are compensated accordingly. The simulation and experimental results verify the feasibility and robustness of the motion-estimated PSP for the in situ 3-D measurements of nonuniform moving objects. |
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| AbstractList | Phase-shifting profilometry (PSP) via sequential fringe projection is applicable for high-accuracy 3-D measurements of static objects. However, moving objects cannot be static or quasi-static during one projection cycle, thereby causing surface misalignment and phase errors in 3-D measurements. This article proposes a motion-estimated PSP based on the fringe-oriented synthetic phase correlation algorithm (FO-SPCA), which achieves automatic 3-D measurements of objects in nonuniform 2-D motion. To robustly estimate the motion of objects among fringe images, the proposed fringe-oriented feature extraction technique obtains the surface features by eliminating the modulation influence of sinusoidal illumination. Furthermore, the FO-SPCA is developed to accurately detect the subpixel displacements of moving objects according to object surface features. With the subpixel displacements, the alignment procedure is completed through a reverse 2-D transformation and then the phase errors are compensated accordingly. The simulation and experimental results verify the feasibility and robustness of the motion-estimated PSP for the in situ 3-D measurements of nonuniform moving objects. |
| Author | Chen, Huaian Chen, Enhong Duan, Minghui Zhu, Changan Zheng, Jinjin Jin, Yi |
| Author_xml | – sequence: 1 givenname: Minghui orcidid: 0000-0001-6878-5834 surname: Duan fullname: Duan, Minghui organization: Department of Precision Machinery and Precision Instruments, University of Science and Technology of China, Anhui, China – sequence: 2 givenname: Yi orcidid: 0000-0001-8232-3863 surname: Jin fullname: Jin, Yi email: jinyi08@ustc.edu.cn organization: Department of Precision Machinery and Precision Instruments, University of Science and Technology of China, Anhui, China – sequence: 3 givenname: Huaian orcidid: 0000-0003-3999-2206 surname: Chen fullname: Chen, Huaian organization: Department of Precision Machinery and Precision Instruments, University of Science and Technology of China, Anhui, China – sequence: 4 givenname: Jinjin orcidid: 0000-0003-4663-5880 surname: Zheng fullname: Zheng, Jinjin organization: Department of Precision Machinery and Precision Instruments, University of Science and Technology of China, Anhui, China – sequence: 5 givenname: Changan orcidid: 0000-0003-1736-0849 surname: Zhu fullname: Zhu, Changan organization: Department of Precision Machinery and Precision Instruments, University of Science and Technology of China, Anhui, China – sequence: 6 givenname: Enhong orcidid: 0000-0002-4835-4102 surname: Chen fullname: Chen, Enhong organization: Department of Computer Science, University of Science and Technology of China, Anhui, China |
| BookMark | eNp9kEtLAzEUhYNUsK3uBTcDrqfmMXlthFJfhdZu6jqkmYxO6SQ1yQj-e1NaXLhwdc_ifPfANwID550F4BrBCUJQ3q3nywmGGE0IggwheQaGiFJeSsbwAAwhRKKUFWUXYBTjFkLIWcWH4H7aJ9_p1JqClA_F0urYB9tZl3JOH74uGh-KV-961-bUFUv_1br3YrXZWpPiJThv9C7aq9Mdg7enx_XspVysnuez6aI0WKJUWrzBjMhaU2k41U0lTCU0amBNjCDS2MrU3PJG8Arphm64qC02GGPBNOGsJmNwe_y7D_6ztzGpre-Dy5MKUyYgwxLD3ILHlgk-xmAbtQ9tp8O3QlAdLKlsSR0sqZOljLA_iGlT1uFdCrrd_QfeHMHWWvu7IyniWFTkB1f-dTs |
| CODEN | IEIMAO |
| CitedBy_id | crossref_primary_10_1364_AO_499592 crossref_primary_10_1109_TIE_2024_3447752 crossref_primary_10_3390_metrology5030047 crossref_primary_10_1109_TIM_2025_3555717 crossref_primary_10_1109_JSEN_2025_3561802 crossref_primary_10_1109_TIM_2024_3406828 crossref_primary_10_1109_TIM_2022_3212743 crossref_primary_10_1109_TIM_2023_3318730 crossref_primary_10_1109_JSEN_2024_3477917 crossref_primary_10_1109_TIM_2022_3160545 crossref_primary_10_1109_TIP_2024_3381773 crossref_primary_10_1109_TIM_2022_3186705 crossref_primary_10_1109_TIM_2024_3481542 |
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| ContentType | Journal Article |
| Copyright | Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2021 |
| Copyright_xml | – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2021 |
| DBID | 97E RIA RIE AAYXX CITATION 7SP 7U5 8FD L7M |
| DOI | 10.1109/TIM.2021.3106119 |
| DatabaseName | IEEE Xplore (IEEE) IEEE All-Society Periodicals Package (ASPP) 1998–Present IEEE CrossRef Electronics & Communications Abstracts Solid State and Superconductivity Abstracts Technology Research Database Advanced Technologies Database with Aerospace |
| DatabaseTitle | CrossRef Solid State and Superconductivity Abstracts Technology Research Database Advanced Technologies Database with Aerospace Electronics & Communications Abstracts |
| DatabaseTitleList | Solid State and Superconductivity Abstracts |
| Database_xml | – sequence: 1 dbid: RIE name: IEEE url: https://ieeexplore.ieee.org/ sourceTypes: Publisher |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Engineering Physics |
| EISSN | 1557-9662 |
| EndPage | 11 |
| ExternalDocumentID | 10_1109_TIM_2021_3106119 9517284 |
| Genre | orig-research |
| GrantInformation_xml | – fundername: Research on the Major Scientific Instrument of National Natural Science Foundation of China grantid: 61727809 funderid: 10.13039/501100001809 – fundername: Anhui Science and Technology Department grantid: 201903c08020002 funderid: 10.13039/501100010816 |
| GroupedDBID | -~X 0R~ 29I 4.4 5GY 5VS 6IK 85S 8WZ 97E A6W AAJGR AARMG AASAJ AAWTH ABAZT ABQJQ ABVLG ACGFO ACIWK ACNCT AENEX AETIX AGQYO AGSQL AHBIQ AI. AIBXA AKJIK AKQYR ALLEH ALMA_UNASSIGNED_HOLDINGS ATWAV BEFXN BFFAM BGNUA BKEBE BPEOZ CS3 DU5 EBS EJD F5P HZ~ H~9 IAAWW IBMZZ ICLAB IDIHD IFIPE IFJZH IPLJI JAVBF LAI M43 O9- OCL P2P RIA RIE RNS TN5 TWZ VH1 VJK AAYXX CITATION 7SP 7U5 8FD L7M |
| ID | FETCH-LOGICAL-c291t-e2b2639da59c75af48c48a1f0d3c839ce4cd7e7f8741af5b78de2c22286a376d3 |
| IEDL.DBID | RIE |
| ISICitedReferencesCount | 23 |
| ISICitedReferencesURI | http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000698640700001&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D |
| ISSN | 0018-9456 |
| IngestDate | Mon Jun 30 10:21:47 EDT 2025 Tue Nov 18 22:17:18 EST 2025 Sat Nov 29 04:38:14 EST 2025 Wed Aug 27 02:27:33 EDT 2025 |
| IsPeerReviewed | true |
| IsScholarly | true |
| Language | English |
| License | https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html https://doi.org/10.15223/policy-029 https://doi.org/10.15223/policy-037 |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-LOGICAL-c291t-e2b2639da59c75af48c48a1f0d3c839ce4cd7e7f8741af5b78de2c22286a376d3 |
| Notes | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 |
| ORCID | 0000-0003-3999-2206 0000-0002-4835-4102 0000-0001-8232-3863 0000-0003-4663-5880 0000-0003-1736-0849 0000-0001-6878-5834 |
| PQID | 2568062920 |
| PQPubID | 85462 |
| PageCount | 11 |
| ParticipantIDs | ieee_primary_9517284 crossref_primary_10_1109_TIM_2021_3106119 proquest_journals_2568062920 crossref_citationtrail_10_1109_TIM_2021_3106119 |
| PublicationCentury | 2000 |
| PublicationDate | 20210000 2021-00-00 20210101 |
| PublicationDateYYYYMMDD | 2021-01-01 |
| PublicationDate_xml | – year: 2021 text: 20210000 |
| PublicationDecade | 2020 |
| PublicationPlace | New York |
| PublicationPlace_xml | – name: New York |
| PublicationTitle | IEEE transactions on instrumentation and measurement |
| PublicationTitleAbbrev | TIM |
| PublicationYear | 2021 |
| Publisher | IEEE The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher_xml | – name: IEEE – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| References | ref13 ref12 ref15 ref14 ref31 ref30 ref11 ref10 ref2 ref1 ref17 ref16 ref19 ref18 ref24 ref23 ref20 kuglin (ref25) 0; 1975 ref22 ref21 ref28 ref27 ref29 ref8 zhang (ref7) 2016 ref9 ref4 papoulis (ref26) 1977 ref3 ref6 ref5 |
| References_xml | – ident: ref15 doi: 10.1109/TIE.2017.2787545 – ident: ref4 doi: 10.1016/j.ymssp.2017.09.002 – ident: ref21 doi: 10.1109/JSTARS.2019.2937690 – ident: ref30 doi: 10.1109/83.988953 – ident: ref10 doi: 10.1364/OE.24.018445 – ident: ref27 doi: 10.1109/TIP.2011.2156420 – ident: ref29 doi: 10.1109/TGRS.2015.2391999 – ident: ref20 doi: 10.1109/TASE.2019.2950005 – ident: ref8 doi: 10.1364/AO.52.007094 – ident: ref14 doi: 10.1016/j.optlaseng.2017.12.001 – ident: ref11 doi: 10.1364/AO.34.001872 – ident: ref16 doi: 10.1109/TII.2020.2967543 – ident: ref23 doi: 10.1088/0957-0233/17/6/045 – ident: ref17 doi: 10.1364/OE.21.030610 – year: 2016 ident: ref7 publication-title: High-speed 3D imaging with digital fringe projection technique – ident: ref9 doi: 10.1364/AO.32.003047 – ident: ref19 doi: 10.1364/OE.25.032120 – ident: ref12 doi: 10.1364/OE.26.034224 – ident: ref18 doi: 10.1364/OE.27.022100 – ident: ref5 doi: 10.1364/OE.25.027270 – ident: ref28 doi: 10.1109/TMI.2002.808359 – ident: ref2 doi: 10.1109/CVPR.2007.383291 – ident: ref24 doi: 10.1364/OL.33.000156 – ident: ref31 doi: 10.1109/CVPR.2005.177 – ident: ref22 doi: 10.1109/TFUZZ.2010.2064170 – volume: 1975 start-page: 163 year: 0 ident: ref25 article-title: The phase correlation image alignment method publication-title: Proc IEEE Int Conf Cybern Soc – year: 1977 ident: ref26 publication-title: Signal Analysis – ident: ref1 doi: 10.1109/TIP.2015.2481707 – ident: ref3 doi: 10.1016/j.patcog.2010.03.004 – ident: ref13 doi: 10.1364/OL.39.006715 – ident: ref6 doi: 10.1364/OL.28.000887 |
| SSID | ssj0007647 |
| Score | 2.4177885 |
| Snippet | Phase-shifting profilometry (PSP) via sequential fringe projection is applicable for high-accuracy 3-D measurements of static objects. However, moving objects... |
| SourceID | proquest crossref ieee |
| SourceType | Aggregation Database Enrichment Source Index Database Publisher |
| StartPage | 1 |
| SubjectTerms | <italic xmlns:ali="http://www.niso.org/schemas/ali/1.0/" xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance">In situ 3-D shape measurements Algorithms Correlation Displacement measurement Feature extraction Forecasting Frequency-domain analysis Image registration Measurement methods Misalignment Moving object recognition Phase measurement phase-shifting profilometry (PSP) Pixels Principal component analysis Static objects subpixel fringe image registration surface misalignment and phase errors |
| Title | Automatic 3-D Measurement Method for Nonuniform Moving Objects |
| URI | https://ieeexplore.ieee.org/document/9517284 https://www.proquest.com/docview/2568062920 |
| Volume | 70 |
| WOSCitedRecordID | wos000698640700001&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| journalDatabaseRights | – providerCode: PRVIEE databaseName: IEEE customDbUrl: eissn: 1557-9662 dateEnd: 99991231 omitProxy: false ssIdentifier: ssj0007647 issn: 0018-9456 databaseCode: RIE dateStart: 19630101 isFulltext: true titleUrlDefault: https://ieeexplore.ieee.org/ providerName: IEEE |
| link | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV3dS8MwED_mUNAHPzbF6ZQ--CJY14-0SV-EoQ4FN32YsreSplcQtJN19e_3knZzoAi-BZqEcknufvdL7g7gjMkABU9DG33kNhNeYtMukXYm_BClTJRvSrK8PPDRSEwm0VMDLpaxMIhoHp_hpW6au_x0qkpNlfUIDXBSp2uwxnlYxWottS4PWZUf06UDTKhgcSXpRL3x_ZAcQc8l_5Ssl86ps2KCTE2VH4rYWJfBzv_-axe2axRp9atl34MG5i3YWskt2IIN87ZTFW246pfzqcnMavn2jTX8ZgWpretHWwRcrdE0L3MdpvVuDQ3LYD0mmqMp9uF5cDu-vrPrsgm28iJ3bqOXeIQ7UhlEigcyY0IxId3MSX1FcEghUylHngkCEzILEi5S9JRmgkJJ6ib1D6CZT3M8BMtRmciUZIFUjGGA9J3cRUIYiVAeC5MO9BaSjFWdU1yXtniLjW_hRDHJPtayj2vZd-B8OeKjyqfxR9-2lvWyXy3mDnQXixXXB66ICbkJJ9Slt45-H3UMm3ruij3pQnM-K_EE1tXn_LWYnZq99AVD98Vq |
| linkProvider | IEEE |
| linkToHtml | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV3dS8MwED90KuqDH5vidGoffBGs69q0SV-EoY4Nt-nDlL2VNL2CoJ3sw7_fS9rNgSL4FmhCyiW5-90vuTuACyZ9FDwJbPSQ20y4sU27RNqp8AKUMlaeKcny0uX9vhgOw6cVuFrEwiCieXyG17pp7vKTkZppqqxOaICTOl2FNZ8x18mjtRZ6lwcsz5DZoCNMuGB-KemE9UGnR66g2yAPleyXzqqzZIRMVZUfqtjYl9bu__5sD3YKHGk184XfhxXMyrC9lF2wDBvmdaeaVOCmOZuOTG5Wy7PvrN43L0htXUHaIuhq9UfZLNOBWu9Wz_AM1mOsWZrJATy37ge3bbsonGArN2xMbXRjl5BHIv1QcV-mTCgmZCN1Ek8RIFLIVMKRp4LghEz9mIsEXaW5oECSwkm8QyhlowyPwHJUKlIlmS8VY-gjfSeHkTBGLJTLgrgK9bkkI1VkFdfFLd4i4104YUSyj7Tso0L2VbhcjPjIM2r80beiZb3oV4i5CrX5YkXFkZtEhN2EE-jiW8e_jzqHzfag1426nf7DCWzpeXIupQal6XiGp7CuPqevk_GZ2Vdfti3IsQ |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Automatic+3-D+Measurement+Method+for+Nonuniform+Moving+Objects&rft.jtitle=IEEE+transactions+on+instrumentation+and+measurement&rft.au=Duan%2C+Minghui&rft.au=Jin%2C+Yi&rft.au=Chen%2C+Huaian&rft.au=Zheng%2C+Jinjin&rft.date=2021&rft.pub=IEEE&rft.issn=0018-9456&rft.volume=70&rft.spage=1&rft.epage=11&rft_id=info:doi/10.1109%2FTIM.2021.3106119&rft.externalDocID=9517284 |
| thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0018-9456&client=summon |
| thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0018-9456&client=summon |
| thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0018-9456&client=summon |