SPICE-Based Multiphysics Model to Analyze the Dynamics of Ferroelectric Negative-Capacitance-Electrostatic MEMS Hybrid Actuators
We propose a Simulation Program with Integrated Circuit Emphasis (SPICE)-based multiphysics framework to model ferroelectric negative-capacitance-electrostatic microelectromechanical systems (MEMS) hybrid actuators. Our approach couples the nonlinear dynamics of both the ferroelectric capacitor and...
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| Published in: | IEEE transactions on electron devices Vol. 67; no. 11; pp. 5174 - 5181 |
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| Main Authors: | , |
| Format: | Journal Article |
| Language: | English |
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New York
IEEE
01.11.2020
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
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| ISSN: | 0018-9383, 1557-9646 |
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| Abstract | We propose a Simulation Program with Integrated Circuit Emphasis (SPICE)-based multiphysics framework to model ferroelectric negative-capacitance-electrostatic microelectromechanical systems (MEMS) hybrid actuators. Our approach couples the nonlinear dynamics of both the ferroelectric capacitor and the MEMS actuator. Using this framework, we examine the dynamic response and the energy consumed during pull-in switching of the hybrid actuator. We predict a significant reduction in the dynamic pull-in and pull-out voltages and the energy consumed by the hybrid actuator compared with the standalone MEMS actuator. We also predict that the pull-in time of the hybrid actuator is, however, larger than that of the standalone actuator. Nevertheless, we show that one can tradeoff a small part of the reduction in actuation voltage to achieve identical pull-in times in the hybrid and standalone MEMS actuators while still consuming substantially lower energy in the former compared with the latter. Our analysis approach is compatible with standard circuit simulators and is, hence, suitable for analysis and evaluation of various heterogeneous systems consisting of hybrid MEMS actuators and other electronic devices. |
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| AbstractList | We propose a Simulation Program with Integrated Circuit Emphasis (SPICE)-based multiphysics framework to model ferroelectric negative-capacitance–electrostatic microelectromechanical systems (MEMS) hybrid actuators. Our approach couples the nonlinear dynamics of both the ferroelectric capacitor and the MEMS actuator. Using this framework, we examine the dynamic response and the energy consumed during pull-in switching of the hybrid actuator. We predict a significant reduction in the dynamic pull-in and pull-out voltages and the energy consumed by the hybrid actuator compared with the standalone MEMS actuator. We also predict that the pull-in time of the hybrid actuator is, however, larger than that of the standalone actuator. Nevertheless, we show that one can tradeoff a small part of the reduction in actuation voltage to achieve identical pull-in times in the hybrid and standalone MEMS actuators while still consuming substantially lower energy in the former compared with the latter. Our analysis approach is compatible with standard circuit simulators and is, hence, suitable for analysis and evaluation of various heterogeneous systems consisting of hybrid MEMS actuators and other electronic devices. |
| Author | Ajoy, Arvind Raman, Raghuram Tattamangalam |
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| References | ref35 ref13 ref34 ref12 ref37 ref15 ref36 ref14 ref31 senturia (ref32) 2007 ref30 ref11 ref10 vladimirescu (ref17) 1994 ref39 ref38 ref16 ref19 ref18 dumas (ref2) 2010 peši? (ref28) 2017; 16 ref24 ref23 ref26 ref20 ref42 brandt (ref3) 2008 ref41 ref22 ref21 (ref1) 2018 ref27 ref29 ref8 ref7 rebeiz (ref9) 2004 ref4 ref6 ref5 ref40 shekhar (ref33) 2012; 2 tattamangalam raman (ref25) 2020 |
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| Snippet | We propose a Simulation Program with Integrated Circuit Emphasis (SPICE)-based multiphysics framework to model ferroelectric negative-capacitance-electrostatic... We propose a Simulation Program with Integrated Circuit Emphasis (SPICE)-based multiphysics framework to model ferroelectric negative-capacitance–electrostatic... |
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| SubjectTerms | Actuation Actuation energy Actuators Capacitance Capacitors dynamic pull-in Dynamic response Dynamical systems Electronic devices electrostatic microelectromechanical systems (MEMS) actuator Electrostatics Energy consumption Ferroelectric materials ferroelectric negative capacitance Ferroelectricity Hybrid systems Integrated circuit modeling Integrated circuits Mathematical model Microelectromechanical systems Micromechanical devices Nonlinear dynamics Reduction Simulation Program with Integrated Circuit Emphasis (SPICE)-based multiphysics Simulators SPICE |
| Title | SPICE-Based Multiphysics Model to Analyze the Dynamics of Ferroelectric Negative-Capacitance-Electrostatic MEMS Hybrid Actuators |
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