Sun, Q., & Ge, Z. (2021). Deep Learning for Industrial KPI Prediction: When Ensemble Learning Meets Semi-Supervised Data. IEEE transactions on industrial informatics, 17(1), 260-269. https://doi.org/10.1109/TII.2020.2969709
Chicago Style (17th ed.) CitationSun, Qingqiang, and Zhiqiang Ge. "Deep Learning for Industrial KPI Prediction: When Ensemble Learning Meets Semi-Supervised Data." IEEE Transactions on Industrial Informatics 17, no. 1 (2021): 260-269. https://doi.org/10.1109/TII.2020.2969709.
MLA (9th ed.) CitationSun, Qingqiang, and Zhiqiang Ge. "Deep Learning for Industrial KPI Prediction: When Ensemble Learning Meets Semi-Supervised Data." IEEE Transactions on Industrial Informatics, vol. 17, no. 1, 2021, pp. 260-269, https://doi.org/10.1109/TII.2020.2969709.