Yu, J., Liu, X., & Ye, L. (2021). Convolutional Long Short-Term Memory Autoencoder-Based Feature Learning for Fault Detection in Industrial Processes. IEEE transactions on instrumentation and measurement, 70, 1-15. https://doi.org/10.1109/TIM.2020.3039614
Citácia podle Chicago (17th ed.)Yu, Jianbo, Xing Liu, a Lyujiangnan Ye. "Convolutional Long Short-Term Memory Autoencoder-Based Feature Learning for Fault Detection in Industrial Processes." IEEE Transactions on Instrumentation and Measurement 70 (2021): 1-15. https://doi.org/10.1109/TIM.2020.3039614.
Citácia podľa MLA (8th ed.)Yu, Jianbo, et al. "Convolutional Long Short-Term Memory Autoencoder-Based Feature Learning for Fault Detection in Industrial Processes." IEEE Transactions on Instrumentation and Measurement, vol. 70, 2021, pp. 1-15, https://doi.org/10.1109/TIM.2020.3039614.