Surface charge accumulation and suppression on fullerene-filled epoxy-resin insulator under DC voltage

Surface charge accumulation on the insulator surface and the resulting flashover voltage reduction are considered the primary factors to hinder the large-scale use of HVDC system, especially the gas-insulated system. In this study, Buckminster-fullerene C60 of different loadings is introduced into e...

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Vydáno v:IEEE transactions on dielectrics and electrical insulation Ročník 25; číslo 5; s. 2011 - 2019
Hlavní autoři: Zhang, Boya, Gao, Wenqiang, Hou, Yicen, Zhang, Guixin
Médium: Journal Article
Jazyk:angličtina
Vydáno: New York IEEE 01.10.2018
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Témata:
Accumulation
Buckminsterfullerene
charge accumulation
Charge distribution
Charge materials
charge suppression
Conductivity
Current carriers
Electric potential
epoxy resin
Epoxy resins
Flashover
fullerene
Fullerenes
GIL
HVDC
insulator
Insulators
Loading
Polymer matrix composites
Probe method (forecasting)
Surface charge
Surface charging
Voltage measurement
Voltage reduction
ISSN:1070-9878, 1558-4135
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Abstract Surface charge accumulation on the insulator surface and the resulting flashover voltage reduction are considered the primary factors to hinder the large-scale use of HVDC system, especially the gas-insulated system. In this study, Buckminster-fullerene C60 of different loadings is introduced into epoxy resin for the purpose of restricting the mobility of charge carriers within the material and thus suppressing the charge accumulation on the insulator surface under dc voltage. Experimental results have shown that with the addition of tiny amount of fullerene C60 into epoxy, the conductivity of the composites decreases significantly with the loading and reaches its minimum around 100∼200 ppm, which can be as low as 20% that of neat epoxy. By using the Kelvin-probe method and an advanced inversion algorithm, the surface charge distribution on the fullerene-filled epoxy resin insulators with different filler loadings are obtained. It is observed that the addition of 200 ppm fullerene C60 into epoxy resin can effectively suppress the charge accumulation on the insulator surface. The interfacial polarization model is adopted to interpret the mechanism of surface charge accumulation, which shows that reducing the bulk conductivity of the insulator can effectively suppress the surface charging. This paper provides a potential solution for engineering epoxy based insulators used for the dc power system.
AbstractList Surface charge accumulation on the insulator surface and the resulting flashover voltage reduction are considered the primary factors to hinder the large-scale use of HVDC system, especially the gas-insulated system. In this study, Buckminster-fullerene C60 of different loadings is introduced into epoxy resin for the purpose of restricting the mobility of charge carriers within the material and thus suppressing the charge accumulation on the insulator surface under dc voltage. Experimental results have shown that with the addition of tiny amount of fullerene C60 into epoxy, the conductivity of the composites decreases significantly with the loading and reaches its minimum around 100∼200 ppm, which can be as low as 20% that of neat epoxy. By using the Kelvin-probe method and an advanced inversion algorithm, the surface charge distribution on the fullerene-filled epoxy resin insulators with different filler loadings are obtained. It is observed that the addition of 200 ppm fullerene C60 into epoxy resin can effectively suppress the charge accumulation on the insulator surface. The interfacial polarization model is adopted to interpret the mechanism of surface charge accumulation, which shows that reducing the bulk conductivity of the insulator can effectively suppress the surface charging. This paper provides a potential solution for engineering epoxy based insulators used for the dc power system.
Author Zhang, Boya
Hou, Yicen
Gao, Wenqiang
Zhang, Guixin
Author_xml – sequence: 1
  givenname: Boya
  surname: Zhang
  fullname: Zhang, Boya
  organization: State Key Lab. of Electrical Insulation and Power Equipment, Xi'an Jiaotong University, Shaanxi 710049, China; Department of Electrical Engineering, Tsinghua University, Beijing, 100084 China
– sequence: 2
  givenname: Wenqiang
  surname: Gao
  fullname: Gao, Wenqiang
  organization: Department of Electrical Engineering, Tsinghua University, Beijing, 100084 China; Beijing Kedong Power Control System Co Ltd., Beijing, 100085 China
– sequence: 3
  givenname: Yicen
  surname: Hou
  fullname: Hou, Yicen
  organization: Department of Electrical Engineering, Tsinghua University, Beijing, 100084 China
– sequence: 4
  givenname: Guixin
  surname: Zhang
  fullname: Zhang, Guixin
  organization: Department of Electrical Engineering, Tsinghua University, Beijing, 100084 China
BookMark eNp9kMtr3DAQh0VIIM97oRdBz95q5IekY9jNY2GhhyZnM5ZGqYNXdiQ7ZP_72t3QQw-FgZmB3zcD3yU7DX0gxr6AWAEI8_1pc7ddSQF6JURlKnPCLqAsdVZAXp7Os1AiM1rpc3aZ0qsQUJSyumD-5xQ9WuL2F8YX4mjttJ86HNs-cAyOp2kYIqW07HP5qesoUqDMt_PkOA39xyGbE23gbUgL2kc-BUeRb9b8ve9GfKFrduaxS3Tz2a_Y8_3d0_ox2_142K5vd5mVBsZMNdJL5WyuEb3J0UNBja6EBF26XDWEAI2sEFBpKBrtHGqLzjlTiib3Mr9i3453h9i_TZTG-rWfYphf1hJAzXqUqeaUOKZs7FOK5OshtnuMhxpEvdisF5v1YrM-2pyR6h_EtuMfS2PEtvsf-PUItkT0948udGFA5b8B1LuGJw
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ContentType Journal Article
Copyright Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2018
Copyright_xml – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2018
DBID 97E
RIA
RIE
AAYXX
CITATION
7SP
8FD
L7M
DOI 10.1109/TDEI.2018.006969
DatabaseName IEEE All-Society Periodicals Package (ASPP) 2005–Present
IEEE All-Society Periodicals Package (ASPP) 1998–Present
IEEE Electronic Library (IEL)
CrossRef
Electronics & Communications Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
DatabaseTitle CrossRef
Technology Research Database
Advanced Technologies Database with Aerospace
Electronics & Communications Abstracts
DatabaseTitleList
Technology Research Database
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
Physics
EISSN 1558-4135
EndPage 2019
ExternalDocumentID 10_1109_TDEI_2018_006969
8484917
Genre orig-research
GroupedDBID -~X
0R~
29I
4.4
5GY
5VS
6IK
97E
AAJGR
AARMG
AASAJ
AAWTH
ABAZT
ABQJQ
ABVLG
ACGFO
ACGFS
ACIWK
AENEX
AETIX
AGQYO
AGSQL
AHBIQ
AI.
AIBXA
AKJIK
AKQYR
ALLEH
ALMA_UNASSIGNED_HOLDINGS
ASUFR
ATWAV
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CS3
DU5
EBS
EJD
F5P
HZ~
H~9
ICLAB
IFIPE
IFJZH
IPLJI
JAVBF
LAI
M43
O9-
OCL
P2P
RIA
RIE
RNS
RXW
TAE
TAF
TN5
VH1
AAYXX
CITATION
7SP
8FD
L7M
RIG
ID FETCH-LOGICAL-c291t-7b2f27dc38aaf93af14eb8602185d37bea11b26a1a7814b8dda8caddd950b3f23
IEDL.DBID RIE
ISICitedReferencesCount 65
ISICitedReferencesURI http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000446866400053&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
ISSN 1070-9878
IngestDate Mon Jun 30 10:21:39 EDT 2025
Sat Nov 29 01:46:28 EST 2025
Tue Nov 18 21:05:30 EST 2025
Wed Aug 27 02:54:26 EDT 2025
IsPeerReviewed true
IsScholarly true
Issue 5
Language English
License https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c291t-7b2f27dc38aaf93af14eb8602185d37bea11b26a1a7814b8dda8caddd950b3f23
Notes ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
PQID 2117018796
PQPubID 75745
PageCount 9
ParticipantIDs proquest_journals_2117018796
crossref_citationtrail_10_1109_TDEI_2018_006969
ieee_primary_8484917
crossref_primary_10_1109_TDEI_2018_006969
PublicationCentury 2000
PublicationDate 2018-Oct.
2018-10-00
20181001
PublicationDateYYYYMMDD 2018-10-01
PublicationDate_xml – month: 10
  year: 2018
  text: 2018-Oct.
PublicationDecade 2010
PublicationPlace New York
PublicationPlace_xml – name: New York
PublicationTitle IEEE transactions on dielectrics and electrical insulation
PublicationTitleAbbrev T-DEI
PublicationYear 2018
Publisher IEEE
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher_xml – name: IEEE
– name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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SSID ssj0014526
Score 2.4770186
Snippet Surface charge accumulation on the insulator surface and the resulting flashover voltage reduction are considered the primary factors to hinder the large-scale...
SourceID proquest
crossref
ieee
SourceType Aggregation Database
Enrichment Source
Index Database
Publisher
StartPage 2011
SubjectTerms Accumulation
Buckminsterfullerene
charge accumulation
Charge distribution
Charge materials
charge suppression
Conductivity
Current carriers
Electric potential
epoxy resin
Epoxy resins
Flashover
fullerene
Fullerenes
GIL
HVDC
insulator
Insulators
Loading
Polymer matrix composites
Probe method (forecasting)
Surface charge
Surface charging
Voltage measurement
Voltage reduction
Title Surface charge accumulation and suppression on fullerene-filled epoxy-resin insulator under DC voltage
URI https://ieeexplore.ieee.org/document/8484917
https://www.proquest.com/docview/2117018796
Volume 25
WOSCitedRecordID wos000446866400053&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
journalDatabaseRights – providerCode: PRVIEE
  databaseName: IEEE Electronic Library (IEL)
  customDbUrl:
  eissn: 1558-4135
  dateEnd: 99991231
  omitProxy: false
  ssIdentifier: ssj0014526
  issn: 1070-9878
  databaseCode: RIE
  dateStart: 19940101
  isFulltext: true
  titleUrlDefault: https://ieeexplore.ieee.org/
  providerName: IEEE
link http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LS8NAEB5aUdCDb7FaZQ9eBNcmm2Q3OYpV9FIEK3gL-4SCpNKH6L93Z5OWgiIIOeSwu4R8yezMzjfzAVykqohkxhwVxpvAVOuUqsQ46iMxy6Rl2IIsiE2IwSB_fS2eWnC1rIWx1gbymb3G25DLN2M9x6OyXp7mqQ8v2tAWgte1WsuMAUpl1_zCiPo4Ol-kJKOiN-zfPSKJC1mTvEBq88oWFDRVfhjisLvc7_zvuXZhu_EiyU0N-x60bLUPWyu9BfdhI3A79fQA3PN84qS2JHRFskRqv2Cj2kVkZch0_t7QYSviLzyRD5op1GGhoCHeR__8on7EqCKBu46BOsHqswnp3xJv4GbeKh3Cy_3d8PaBNvIKVLMinlGhmGPC6CSX0hWJdHFqFUpS-S3cJEJZGceKcRlLbIulcmNkrr05NEUWqcSx5AjWqnFlj4F4r8tmaaq54hw9klxm2iZSZFwKoQTvQG_xxkvd9B5HCYy3MsQgUVEiRiViVNYYdeByOeO97rvxx9gDxGQ5roGjA90FqGXzY05Lhko7qLDOT36fdQqbuHTN1-vC2mwyt2ewrj9mo-nkPHxz38xp1ZQ
linkProvider IEEE
linkToHtml http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LS8NAEB58oh58VbFadQ9eBNcmm8cmR9GWiloEK3gL-wRBovQh-u_d2aRFUAQhhxx2k5AvmZ3Z-WY-gJNY5oFImKVcOxMYKxVTGWlLXSRmmDAMW5B5sQne72dPT_n9HJzNamGMMZ58Zs7x1Ofy9aua4FZZO4uz2IUX87CYxDELqmqtWc4AxbIrhmFAXSSdTZOSQd4eXHWukcaFvMk0R3Lzt0XIq6r8MMV-felu_O_JNmG99iPJRQX8FsyZchvWvnUX3IZlz-5UowbYh8nQCmWI74tkiFDugrVuFxGlJqPJW02ILYk7cE_eq6ZQi6WCmjgv_eOTuhHPJfHsdQzVCdafDcnVJXEmbuzs0g48djuDyx6tBRaoYnk4plwyy7hWUSaEzSNhw9hIFKVyi7iOuDQiDCVLRSiwMZbMtBaZcgZR50kgI8uiXVgoX0uzB8T5XcaBolKZpuiTZCJRJhI8SQXnkqdNaE_feKHq7uMogvFS-CgkyAvEqECMigqjJpzOZrxVnTf-GNtATGbjajia0JqCWtS_5qhgqLWDGuvp_u-zjmGlN7i7LW6v-zcHsIq3qdh7LVgYDyfmEJbU-_h5NDzy398XDpXY2w
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Surface+charge+accumulation+and+suppression+on+fullerene-filled+epoxy-resin+insulator+under+DC+voltage&rft.jtitle=IEEE+transactions+on+dielectrics+and+electrical+insulation&rft.au=Zhang%2C+Boya&rft.au=Gao%2C+Wenqiang&rft.au=Hou%2C+Yicen&rft.au=Zhang%2C+Guixin&rft.date=2018-10-01&rft.issn=1070-9878&rft.eissn=1558-4135&rft.volume=25&rft.issue=5&rft.spage=2011&rft.epage=2019&rft_id=info:doi/10.1109%2FTDEI.2018.006969&rft.externalDBID=n%2Fa&rft.externalDocID=10_1109_TDEI_2018_006969
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1070-9878&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1070-9878&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1070-9878&client=summon