Tabanelli, E., Brunelli, D., Acquaviva, A., & Benini, L. (2022). Trimming Feature Extraction and Inference for MCU-Based Edge NILM: A Systematic Approach. IEEE transactions on industrial informatics, 18(2), 943-952. https://doi.org/10.1109/TII.2021.3078186
Citace podle Chicago (17th ed.)Tabanelli, Enrico, Davide Brunelli, Andrea Acquaviva, a Luca Benini. "Trimming Feature Extraction and Inference for MCU-Based Edge NILM: A Systematic Approach." IEEE Transactions on Industrial Informatics 18, no. 2 (2022): 943-952. https://doi.org/10.1109/TII.2021.3078186.
Citace podle MLA (9th ed.)Tabanelli, Enrico, et al. "Trimming Feature Extraction and Inference for MCU-Based Edge NILM: A Systematic Approach." IEEE Transactions on Industrial Informatics, vol. 18, no. 2, 2022, pp. 943-952, https://doi.org/10.1109/TII.2021.3078186.