Ball, D. R., Galloway, K. F., Johnson, R. A., Alles, M. L., Sternberg, A. L., Witulski, A. F., . . . Lauenstein, J. (2021). Effects of Breakdown Voltage on Single-Event Burnout Tolerance of High-Voltage SiC Power MOSFETs. IEEE transactions on nuclear science, 68(7), 1430-1435. https://doi.org/10.1109/TNS.2021.3079846
Chicago-Zitierstil (17. Ausg.)Ball, D. R., et al. "Effects of Breakdown Voltage on Single-Event Burnout Tolerance of High-Voltage SiC Power MOSFETs." IEEE Transactions on Nuclear Science 68, no. 7 (2021): 1430-1435. https://doi.org/10.1109/TNS.2021.3079846.
MLA-Zitierstil (9. Ausg.)Ball, D. R., et al. "Effects of Breakdown Voltage on Single-Event Burnout Tolerance of High-Voltage SiC Power MOSFETs." IEEE Transactions on Nuclear Science, vol. 68, no. 7, 2021, pp. 1430-1435, https://doi.org/10.1109/TNS.2021.3079846.