Random-Effect Models for Degradation Analysis Based on Nonlinear Tweedie Exponential-Dispersion Processes

The degradation data of highly reliable products are usually analyzed by stochastic process models, such as Wiener process, gamma process and inverse Gaussian process models. If such a specific degradation model is wrongly assumed, then poor analysis results of reliability assessment would be obtain...

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Bibliographic Details
Published in:	IEEE transactions on reliability Vol. 71; no. 1; pp. 47 - 62
Main Authors:	Chen, Zhen, Xia, Tangbin, Li, Yaping, Pan, Ershun
Format:	Journal Article
Language:	English
Published:	New York IEEE 01.03.2022 The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subjects:	Analytical models Biological system modeling Degradation Degradation analysis Dispersion Evolutionary algorithms Evolutionary computation exponential-dispersion (ED) process Gaussian process Inference algorithms Mathematical model Mathematical models nonlinearity Numerical models parameter estimation Parameters random effects Reliability analysis Stochastic processes
ISSN:	0018-9529, 1558-1721
Online Access:	Get full text
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