Chen, Z., Xia, T., Li, Y., & Pan, E. (2022). Random-Effect Models for Degradation Analysis Based on Nonlinear Tweedie Exponential-Dispersion Processes. IEEE transactions on reliability, 71(1), 47-62. https://doi.org/10.1109/TR.2021.3107050
Citace podle Chicago (17th ed.)Chen, Zhen, Tangbin Xia, Yaping Li, a Ershun Pan. "Random-Effect Models for Degradation Analysis Based on Nonlinear Tweedie Exponential-Dispersion Processes." IEEE Transactions on Reliability 71, no. 1 (2022): 47-62. https://doi.org/10.1109/TR.2021.3107050.
Citace podle MLA (9th ed.)Chen, Zhen, et al. "Random-Effect Models for Degradation Analysis Based on Nonlinear Tweedie Exponential-Dispersion Processes." IEEE Transactions on Reliability, vol. 71, no. 1, 2022, pp. 47-62, https://doi.org/10.1109/TR.2021.3107050.