Degradation Modeling Using Stochastic Processes With Random Initial Degradation

In degradation tests, it is common to see that the initial degradation levels of test units are heterogeneous. Moreover, the degradation rate of a path may also be correlated with the initial value of the degradation measure. Motivated by this observation, in this paper, we introduce a time shift to...

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Vydáno v:	IEEE transactions on reliability Ročník 68; číslo 4; s. 1320 - 1329
Hlavní autoři:	Shen, Lijuan, Wang, Yudong, Zhai, Qingqing, Tang, Yincai
Médium:	Journal Article
Jazyk:	angličtina
Vydáno:	New York IEEE 01.12.2019 The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Témata:	Analytical models Computer simulation Correlation Data models Degradation Error analysis Estimation Expectation–maximization (EM) algorithm Gallium arsenide lasers Gaussian distribution Gaussian process maximum likelihood estimation Modelling random initial degradation random-effects model Stochastic models stochastic process models Stochastic processes
ISSN:	0018-9529, 1558-1721
On-line přístup:	Získat plný text
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