APA (7th ed.) Citation

Shen, L., Wang, Y., Zhai, Q., & Tang, Y. (2019). Degradation Modeling Using Stochastic Processes With Random Initial Degradation. IEEE transactions on reliability, 68(4), 1320-1329. https://doi.org/10.1109/TR.2018.2885133

Chicago Style (17th ed.) Citation

Shen, Lijuan, Yudong Wang, Qingqing Zhai, and Yincai Tang. "Degradation Modeling Using Stochastic Processes With Random Initial Degradation." IEEE Transactions on Reliability 68, no. 4 (2019): 1320-1329. https://doi.org/10.1109/TR.2018.2885133.

MLA (9th ed.) Citation

Shen, Lijuan, et al. "Degradation Modeling Using Stochastic Processes With Random Initial Degradation." IEEE Transactions on Reliability, vol. 68, no. 4, 2019, pp. 1320-1329, https://doi.org/10.1109/TR.2018.2885133.