Shen, L., Wang, Y., Zhai, Q., & Tang, Y. (2019). Degradation Modeling Using Stochastic Processes With Random Initial Degradation. IEEE transactions on reliability, 68(4), 1320-1329. https://doi.org/10.1109/TR.2018.2885133
Citace podle Chicago (17th ed.)Shen, Lijuan, Yudong Wang, Qingqing Zhai, a Yincai Tang. "Degradation Modeling Using Stochastic Processes With Random Initial Degradation." IEEE Transactions on Reliability 68, no. 4 (2019): 1320-1329. https://doi.org/10.1109/TR.2018.2885133.
Citace podle MLA (9th ed.)Shen, Lijuan, et al. "Degradation Modeling Using Stochastic Processes With Random Initial Degradation." IEEE Transactions on Reliability, vol. 68, no. 4, 2019, pp. 1320-1329, https://doi.org/10.1109/TR.2018.2885133.
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