Efficient post-configuration testing of an asynchronous nanowire crossbar system for reliability

The recently proposed asynchronous nanowire crossbar architecture is envisioned to enhance the manufacturability and robustness of nanowire crossbar-based configurable digital circuits by removing various timing-related failure modes. In order to address this issue, a novel functional testing scheme...

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Vydáno v:	IET computers & digital techniques Ročník 6; číslo 4; s. 214 - 222
Hlavní autoři:	Lee, J.-S., Venkateswaran, S., Choi, M.
Médium:	Journal Article
Jazyk:	angličtina
Vydáno:	Stevenage Institution of Engineering and Technology 01.07.2012 John Wiley & Sons, Inc
Témata:	Algorithms Applied sciences Circuit properties Computer simulation Cross-disciplinary physics: materials science; rheology Design. Technologies. Operation analysis. Testing Digital circuits Electric, optical and optoelectronic circuits Electronic circuits Electronics Exact sciences and technology Functional testing Integrated circuits Manufacturability Materials science Nanoscale materials and structures: fabrication and characterization Nanowires Physics Quantum wires Reconfiguration Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices Threshold gates Performance evaluation Interconnection network Logic gate System reliability Clock Algorithm Failures Logic circuit Nanometer scale Digital circuit Feasibility Robustness Reconfigurable architectures Nanowires Threshold logic Deterministic approach Asynchronous circuit Figure of merit
ISSN:	1751-8601, 1751-861X
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Popis
Shrnutí:	The recently proposed asynchronous nanowire crossbar architecture is envisioned to enhance the manufacturability and robustness of nanowire crossbar-based configurable digital circuits by removing various timing-related failure modes. In order to address this issue, a novel functional testing scheme has been proposed to validate threshold gates configured on programmable gate macro blocks (PGMB). The proposed approach selectively tests the crosspoints programmed as ON-state using test vectors tailored to the given threshold gate macro and its functionality. Therefore high-fault coverage can be achieved at significantly reduced test overhead. Also, numerous replacement and reconfiguration schemes have been proposed based on the proposed functional testing scheme to repair configured PGMBs that are partially faulty by locating incorrectly programmed crosspoints and replacing them with defect-free spares. Specific figures of merit have also been coined to quantify the performance of the proposed testing and reconfiguration algorithms. These findings have been extensively validated by a series of parametric simulations.
Bibliografie:	SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 14 ObjectType-Article-1 ObjectType-Feature-2 content type line 23
ISSN:	1751-8601 1751-861X
DOI:	10.1049/iet-cdt.2011.0025